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Fingerprint Dive into the research topics where Kohei M Itoh is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 2 Similar Profiles
Silicon Chemical Compounds
silicon Physics & Astronomy
Isotopes Engineering & Materials Science
nuclear spin Physics & Astronomy
Germanium Chemical Compounds
isotopes Physics & Astronomy
germanium Physics & Astronomy
electron spin Physics & Astronomy

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Research Output 1991 2019

A silicon quantum-dot-coupled nuclear spin qubit

Hensen, B., Wei Huang, W., Yang, C. H., Wai Chan, K., Yoneda, J., Tanttu, T., Hudson, F. E., Laucht, A., Itoh, K. M., Ladd, T. D., Morello, A. & Dzurak, A. S., 2019 Jan 1, (Accepted/In press) In : Nature Nanotechnology.

Research output: Contribution to journalLetter

Silicon
nuclear spin
Semiconductor quantum dots
quantum dots
Electrons
1 Citation (Scopus)

Controlling Spin-Orbit Interactions in Silicon Quantum Dots Using Magnetic Field Direction

Tanttu, T., Hensen, B., Chan, K. W., Yang, C. H., Huang, W. W., Fogarty, M., Hudson, F., Itoh, K. M., Culcer, D., Laucht, A., Morello, A. & Dzurak, A., 2019 May 10, In : Physical Review X. 9, 2, 021028.

Research output: Contribution to journalArticle

Open Access
spin-orbit interactions
quantum dots
silicon
magnetic fields
shift
1 Citation (Scopus)

Electron spin relaxation of single phosphorus donors in metal-oxide-semiconductor nanoscale devices

Tenberg, S. B., Asaad, S., Madzik, M. T., Johnson, M. A. I., Joecker, B., Laucht, A., Hudson, F. E., Itoh, K. M., Jakob, A. M., Johnson, B. C., Jamieson, D. N., McCallum, J. C., Dzurak, A. S., Joynt, R. & Morello, A., 2019 May 14, In : Physical Review B. 99, 20, 205306.

Research output: Contribution to journalArticle

MOS devices
semiconductor devices
metal oxide semiconductors
electron spin
Phosphorus

Fabrication of Ge MOS with low interface trap density by ALD of Al2O3 on epitaxially grown Ge

Matsuoka, R., Shigesawa, E., Miyamoto, S., Sawano, K. & Itoh, K. M., 2019 Jan 1, In : Semiconductor Science and Technology. 34, 1, 014004.

Research output: Contribution to journalArticle

Atomic layer deposition
atomic layer epitaxy
traps
Fabrication
fabrication
18 Citations (Scopus)

Fidelity benchmarks for two-qubit gates in silicon

Huang, W., Yang, C. H., Chan, K. W., Tanttu, T., Hensen, B., Leon, R. C. C., Fogarty, M. A., Hwang, J. C. C., Hudson, F. E., Itoh, K. M., Morello, A., Laucht, A. & Dzurak, A. S., 2019 May 23, In : Nature. 569, 7757, p. 532-536 5 p.

Research output: Contribution to journalLetter

Benchmarking
Quantum Dots
Silicon
Tomography
Electrons