3D image analysis for evaluating internal deformation/fracture characteristics of materials

Mitsuru Nakazawa, Yoshimitsu Aoki, Masakazu Kobayashi, Hiroyuki Toda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In the past, D/F characteristics, load-deformation relationships until the materials are fractured, have been analyzed on the suiface. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), cracks and particles; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose a method that automatically obtains the corresponding relations ofthe particles from nano-order 3D-CT images at each deformation stage. The particles are deformation-proof and may have different geometries. First of all, some big particles are considered as landmarks and matched between pre- and post-deformation. The results oflandmark matching make it easy to match many remaining particles and pores.

Original languageEnglish
Title of host publicationProceedings - International Conference on Pattern Recognition
Publication statusPublished - 2008
Event2008 19th International Conference on Pattern Recognition, ICPR 2008 - Tampa, FL, United States
Duration: 2008 Dec 82008 Dec 11

Other

Other2008 19th International Conference on Pattern Recognition, ICPR 2008
CountryUnited States
CityTampa, FL
Period08/12/808/12/11

Fingerprint

Image analysis
Cracks
Geometry
Air

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

Cite this

Nakazawa, M., Aoki, Y., Kobayashi, M., & Toda, H. (2008). 3D image analysis for evaluating internal deformation/fracture characteristics of materials. In Proceedings - International Conference on Pattern Recognition [4761648]

3D image analysis for evaluating internal deformation/fracture characteristics of materials. / Nakazawa, Mitsuru; Aoki, Yoshimitsu; Kobayashi, Masakazu; Toda, Hiroyuki.

Proceedings - International Conference on Pattern Recognition. 2008. 4761648.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakazawa, M, Aoki, Y, Kobayashi, M & Toda, H 2008, 3D image analysis for evaluating internal deformation/fracture characteristics of materials. in Proceedings - International Conference on Pattern Recognition., 4761648, 2008 19th International Conference on Pattern Recognition, ICPR 2008, Tampa, FL, United States, 08/12/8.
Nakazawa M, Aoki Y, Kobayashi M, Toda H. 3D image analysis for evaluating internal deformation/fracture characteristics of materials. In Proceedings - International Conference on Pattern Recognition. 2008. 4761648
Nakazawa, Mitsuru ; Aoki, Yoshimitsu ; Kobayashi, Masakazu ; Toda, Hiroyuki. / 3D image analysis for evaluating internal deformation/fracture characteristics of materials. Proceedings - International Conference on Pattern Recognition. 2008.
@inproceedings{a6c10a703baa4910b60b4387faf7b7b9,
title = "3D image analysis for evaluating internal deformation/fracture characteristics of materials",
abstract = "In the past, D/F characteristics, load-deformation relationships until the materials are fractured, have been analyzed on the suiface. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), cracks and particles; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose a method that automatically obtains the corresponding relations ofthe particles from nano-order 3D-CT images at each deformation stage. The particles are deformation-proof and may have different geometries. First of all, some big particles are considered as landmarks and matched between pre- and post-deformation. The results oflandmark matching make it easy to match many remaining particles and pores.",
author = "Mitsuru Nakazawa and Yoshimitsu Aoki and Masakazu Kobayashi and Hiroyuki Toda",
year = "2008",
language = "English",
isbn = "9781424421756",
booktitle = "Proceedings - International Conference on Pattern Recognition",

}

TY - GEN

T1 - 3D image analysis for evaluating internal deformation/fracture characteristics of materials

AU - Nakazawa, Mitsuru

AU - Aoki, Yoshimitsu

AU - Kobayashi, Masakazu

AU - Toda, Hiroyuki

PY - 2008

Y1 - 2008

N2 - In the past, D/F characteristics, load-deformation relationships until the materials are fractured, have been analyzed on the suiface. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), cracks and particles; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose a method that automatically obtains the corresponding relations ofthe particles from nano-order 3D-CT images at each deformation stage. The particles are deformation-proof and may have different geometries. First of all, some big particles are considered as landmarks and matched between pre- and post-deformation. The results oflandmark matching make it easy to match many remaining particles and pores.

AB - In the past, D/F characteristics, load-deformation relationships until the materials are fractured, have been analyzed on the suiface. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), cracks and particles; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose a method that automatically obtains the corresponding relations ofthe particles from nano-order 3D-CT images at each deformation stage. The particles are deformation-proof and may have different geometries. First of all, some big particles are considered as landmarks and matched between pre- and post-deformation. The results oflandmark matching make it easy to match many remaining particles and pores.

UR - http://www.scopus.com/inward/record.url?scp=77957934481&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77957934481&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781424421756

BT - Proceedings - International Conference on Pattern Recognition

ER -