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6W/25mm2 inductive power transfer for non-contact wafer-level testing
Andrzej Radecki, Hayun Chung, Yoichi Yoshida, Noriyuki Miura, Tsunaaki Shidei, Hiroki Ishikuro, Tadahiro Kuroda
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
42
Citations
(Scopus)