A 0.0058mm2 7.0 ENOB 24MS/s 17fJ/conv. threshold configuring SAR ADC with source voltage shifting and interpolation technique

Kentaro Yoshioka, Akira Shikata, Ryota Sekimoto, Tadahiro Kuroda, Hiroki Ishikuro

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)

    Abstract

    An extremely low power and area efficient threshold configuring ADC (TC-ADC) is proposed. The threshold configuring comparator (TCC) performs a binary search and only 1b-DAC is required. 5b conversion is carried out by TCC with source voltage shifting technique. Additional 2b resolution is achieved by the proposed threshold interpolation (TI) technique with only 15% power overhead. Prototype ADC in 40nm CMOS occupies a core area of only 0.0038mm 2 and when calibration circuit included, 0.0058 mm2. With a supply voltage of 0.7V, the ADC achieves 7.0 ENOB with 24MS/s. Peak FoM of 9.8fJ/conv. is obtained at 0.5V supply, which is over 15x improvement compared with conventional TC-ADC.

    Original languageEnglish
    Title of host publication2013 Symposium on VLSI Circuits, VLSIC 2013 - Digest of Technical Papers
    PagesC266-C267
    Publication statusPublished - 2013 Sep 17
    Event2013 Symposium on VLSI Circuits, VLSIC 2013 - Kyoto, Japan
    Duration: 2013 Jun 122013 Jun 14

    Publication series

    NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers

    Other

    Other2013 Symposium on VLSI Circuits, VLSIC 2013
    CountryJapan
    CityKyoto
    Period13/6/1213/6/14

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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  • Cite this

    Yoshioka, K., Shikata, A., Sekimoto, R., Kuroda, T., & Ishikuro, H. (2013). A 0.0058mm2 7.0 ENOB 24MS/s 17fJ/conv. threshold configuring SAR ADC with source voltage shifting and interpolation technique. In 2013 Symposium on VLSI Circuits, VLSIC 2013 - Digest of Technical Papers (pp. C266-C267). [6578689] (IEEE Symposium on VLSI Circuits, Digest of Technical Papers).