A 40-to-44Gb/s 3× oversampling CMOS CDR/1:16 DEMUX

Nikola Nedovic, Nestoras Tzartzanis, Hirotaka Tamura, Francis Rotella, Magnus Wiklund, Yuma Mizutani, Yusuke Okanlwa, Tadahiro Kuroda, Junji Ogawa, William Walker

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)

    Abstract

    A 3× oversampling CDR and 1:16 DEWUX occupies 0.8×1.8mm 2 in a 90nm CMOS process. The chip operates at 40 to 44Gb/s and dissipates 0 91W. Input data is sampled using a 24-phase distributed VCO and a digital CDR recovers 16 bits and a 2.5GHz clock from 48 demultiplexed samples spanning 16UI. Conformance to the ITU G.8251 jitter tolerance mask (BER <10-12 with a 231-1 PRBS source) is demonstrated.

    Original languageEnglish
    Title of host publication2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages224-226
    Number of pages3
    ISBN (Print)1424408539, 9781424408535
    DOIs
    Publication statusPublished - 2007
    Event54th IEEE International Solid-State Circuits Conference, ISSCC 2007 - San Francisco, CA, United States
    Duration: 2007 Feb 112007 Feb 15

    Publication series

    NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
    ISSN (Print)0193-6530

    Other

    Other54th IEEE International Solid-State Circuits Conference, ISSCC 2007
    CountryUnited States
    CitySan Francisco, CA
    Period07/2/1107/2/15

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Fingerprint Dive into the research topics of 'A 40-to-44Gb/s 3× oversampling CMOS CDR/1:16 DEMUX'. Together they form a unique fingerprint.

  • Cite this

    Nedovic, N., Tzartzanis, N., Tamura, H., Rotella, F., Wiklund, M., Mizutani, Y., Okanlwa, Y., Kuroda, T., Ogawa, J., & Walker, W. (2007). A 40-to-44Gb/s 3× oversampling CMOS CDR/1:16 DEMUX. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers (pp. 224-226). [4242346] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2007.373375