TY - GEN
T1 - A 40-to-44Gb/s 3× oversampling CMOS CDR/1:16 DEMUX
AU - Nedovic, Nikola
AU - Tzartzanis, Nestoras
AU - Tamura, Hirotaka
AU - Rotella, Francis
AU - Wiklund, Magnus
AU - Mizutani, Yuma
AU - Okanlwa, Yusuke
AU - Kuroda, Tadahiro
AU - Ogawa, Junji
AU - Walker, William
PY - 2007
Y1 - 2007
N2 - A 3× oversampling CDR and 1:16 DEWUX occupies 0.8×1.8mm 2 in a 90nm CMOS process. The chip operates at 40 to 44Gb/s and dissipates 0 91W. Input data is sampled using a 24-phase distributed VCO and a digital CDR recovers 16 bits and a 2.5GHz clock from 48 demultiplexed samples spanning 16UI. Conformance to the ITU G.8251 jitter tolerance mask (BER <10-12 with a 231-1 PRBS source) is demonstrated.
AB - A 3× oversampling CDR and 1:16 DEWUX occupies 0.8×1.8mm 2 in a 90nm CMOS process. The chip operates at 40 to 44Gb/s and dissipates 0 91W. Input data is sampled using a 24-phase distributed VCO and a digital CDR recovers 16 bits and a 2.5GHz clock from 48 demultiplexed samples spanning 16UI. Conformance to the ITU G.8251 jitter tolerance mask (BER <10-12 with a 231-1 PRBS source) is demonstrated.
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U2 - 10.1109/ISSCC.2007.373375
DO - 10.1109/ISSCC.2007.373375
M3 - Conference contribution
AN - SCOPUS:34548829073
SN - 1424408539
SN - 9781424408535
T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference
SP - 224
EP - 226
BT - 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 54th IEEE International Solid-State Circuits Conference, ISSCC 2007
Y2 - 11 February 2007 through 15 February 2007
ER -