A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating

Ryota Sekimoto, Akira Shikata, Kentaro Yoshioka, Tadahiro Kuroda, Hiroki Ishikuro

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

This paper presents an ultra low power and ultra low voltage SAR ADC. Full asynchronous operation and boosted self power gating are proposed to improve conversion accuracy and reduce static leakage power. Test chip fabricated in 40nm CMOS process has successfully reduced leakage power by 98% and it performs ENOB of 8.2bit and consumes only 0.65nW with 0.1kS/s at 0.5V. The power consumption is scalable up to 4MS/s and power supply range from 0.4 to 0.7V. The best figure of merit (FoM) of 5.2fJ/conversion-step was obtained with 20kS/s at 0.5V.

Original languageEnglish
Title of host publicationProceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC
Pages161-164
Number of pages4
DOIs
Publication statusPublished - 2012
Event2012 IEEE Asian Solid-State Circuits Conference, A-SSCC 2012 - Kobe, Japan
Duration: 2012 Nov 12 → 2012 Nov 14

Other

Other2012 IEEE Asian Solid-State Circuits Conference, A-SSCC 2012
CountryJapan
CityKobe
Period12/11/12 → 12/11/14

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Sekimoto, R., Shikata, A., Yoshioka, K., Kuroda, T., & Ishikuro, H. (2012). A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating. In Proceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC (pp. 161-164). [6522650] https://doi.org/10.1109/IPEC.2012.6522650

A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating. / Sekimoto, Ryota; Shikata, Akira; Yoshioka, Kentaro; Kuroda, Tadahiro; Ishikuro, Hiroki.

Proceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC. 2012. p. 161-164 6522650.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sekimoto, R, Shikata, A, Yoshioka, K, Kuroda, T & Ishikuro, H 2012, A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating. in Proceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC., 6522650, pp. 161-164, 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC 2012, Kobe, Japan, 12/11/12. https://doi.org/10.1109/IPEC.2012.6522650
Sekimoto R, Shikata A, Yoshioka K, Kuroda T, Ishikuro H. A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating. In Proceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC. 2012. p. 161-164. 6522650 https://doi.org/10.1109/IPEC.2012.6522650
Sekimoto, Ryota ; Shikata, Akira ; Yoshioka, Kentaro ; Kuroda, Tadahiro ; Ishikuro, Hiroki. / A 40nm CMOS full asynchronous nano-watt SAR ADC with 98% leakage power reduction by boosted self power gating. Proceedings - 2012 IEEE Asian Solid-State Circuits Conference, A-SSCC. 2012. pp. 161-164
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