TY - JOUR

T1 - A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering

AU - Shigeru, Tanaka

AU - Okamori, Katsutaka

AU - Hashimoto, Yoshikazu

AU - Sato, Souichi

N1 - Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.

PY - 1990

Y1 - 1990

N2 - Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

AB - Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

KW - XRF analysis

KW - an intensity ratio between Compton and Thomson scattering

KW - correction of X-ray absorption effect

KW - low atomic number elements in aerosols

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U2 - 10.2116/bunsekikagaku.39.7_T107

DO - 10.2116/bunsekikagaku.39.7_T107

M3 - Article

AN - SCOPUS:85008067218

VL - 39

SP - T107-T112

JO - Bunseki Kagaku

JF - Bunseki Kagaku

SN - 0525-1931

IS - 7

ER -