A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering

Tanaka Shigeru, Katsutaka Okamori, Yoshikazu Hashimoto, Souichi Sato

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

Original languageEnglish
Pages (from-to)T107-T112
JournalBunseki Kagaku
Volume39
Issue number7
DOIs
Publication statusPublished - 1990

Fingerprint

Aerosols
Scattering
X ray absorption
X ray scattering
Alkalies
Fusion reactions
Wavelength

Keywords

  • an intensity ratio between Compton and Thomson scattering
  • correction of X-ray absorption effect
  • low atomic number elements in aerosols
  • XRF analysis

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering. / Shigeru, Tanaka; Okamori, Katsutaka; Hashimoto, Yoshikazu; Sato, Souichi.

In: Bunseki Kagaku, Vol. 39, No. 7, 1990, p. T107-T112.

Research output: Contribution to journalArticle

Shigeru, Tanaka ; Okamori, Katsutaka ; Hashimoto, Yoshikazu ; Sato, Souichi. / A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering. In: Bunseki Kagaku. 1990 ; Vol. 39, No. 7. pp. T107-T112.
@article{733c8b739f864df3a8c0d4d1b0ae4cd9,
title = "A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering",
abstract = "Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.",
keywords = "an intensity ratio between Compton and Thomson scattering, correction of X-ray absorption effect, low atomic number elements in aerosols, XRF analysis",
author = "Tanaka Shigeru and Katsutaka Okamori and Yoshikazu Hashimoto and Souichi Sato",
year = "1990",
doi = "10.2116/bunsekikagaku.39.7_T107",
language = "English",
volume = "39",
pages = "T107--T112",
journal = "Bunseki Kagaku",
issn = "0525-1931",
publisher = "Japan Society for Analytical Chemistry",
number = "7",

}

TY - JOUR

T1 - A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering

AU - Shigeru, Tanaka

AU - Okamori, Katsutaka

AU - Hashimoto, Yoshikazu

AU - Sato, Souichi

PY - 1990

Y1 - 1990

N2 - Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

AB - Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (ICom/IThom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (ICom/IThom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.

KW - an intensity ratio between Compton and Thomson scattering

KW - correction of X-ray absorption effect

KW - low atomic number elements in aerosols

KW - XRF analysis

UR - http://www.scopus.com/inward/record.url?scp=85008067218&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85008067218&partnerID=8YFLogxK

U2 - 10.2116/bunsekikagaku.39.7_T107

DO - 10.2116/bunsekikagaku.39.7_T107

M3 - Article

AN - SCOPUS:85008067218

VL - 39

SP - T107-T112

JO - Bunseki Kagaku

JF - Bunseki Kagaku

SN - 0525-1931

IS - 7

ER -