A first-principles core-level XPS study on the boron impurities in germanium crystal

Jun Yamauchi, Yoshihide Yoshimoto, Yuji Suwa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We systematically investigated the x-ray photoelectron spectroscopy (XPS) core-level shifts and formation energies of boron defects in germanium crystals and compared the results to those in silicon crystals. Both for XPS core-level shifts and formation energies, relationship between defects in Si and Ge is roughly linear. From the similarity in the formation energy, it is expected that the exotic clusters like icosahedral B12 exist in Ge as well as in Si.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
PublisherAmerican Institute of Physics Inc.
Pages41-42
Number of pages2
Volume1566
ISBN (Print)9780735411944
DOIs
Publication statusPublished - 2013
Event31st International Conference on the Physics of Semiconductors, ICPS 2012 - Zurich, Switzerland
Duration: 2012 Jul 292012 Aug 3

Other

Other31st International Conference on the Physics of Semiconductors, ICPS 2012
CountrySwitzerland
CityZurich
Period12/7/2912/8/3

Fingerprint

energy of formation
x ray spectroscopy
germanium
boron
photoelectron spectroscopy
impurities
crystals
shift
defects
energy
silicon

Keywords

  • boron
  • cluster
  • defect
  • first-principles study
  • germanium
  • XPS(x-ray photoelectron spectroscopy)

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Yamauchi, J., Yoshimoto, Y., & Suwa, Y. (2013). A first-principles core-level XPS study on the boron impurities in germanium crystal. In AIP Conference Proceedings (Vol. 1566, pp. 41-42). American Institute of Physics Inc.. https://doi.org/10.1063/1.4848275

A first-principles core-level XPS study on the boron impurities in germanium crystal. / Yamauchi, Jun; Yoshimoto, Yoshihide; Suwa, Yuji.

AIP Conference Proceedings. Vol. 1566 American Institute of Physics Inc., 2013. p. 41-42.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yamauchi, J, Yoshimoto, Y & Suwa, Y 2013, A first-principles core-level XPS study on the boron impurities in germanium crystal. in AIP Conference Proceedings. vol. 1566, American Institute of Physics Inc., pp. 41-42, 31st International Conference on the Physics of Semiconductors, ICPS 2012, Zurich, Switzerland, 12/7/29. https://doi.org/10.1063/1.4848275
Yamauchi J, Yoshimoto Y, Suwa Y. A first-principles core-level XPS study on the boron impurities in germanium crystal. In AIP Conference Proceedings. Vol. 1566. American Institute of Physics Inc. 2013. p. 41-42 https://doi.org/10.1063/1.4848275
Yamauchi, Jun ; Yoshimoto, Yoshihide ; Suwa, Yuji. / A first-principles core-level XPS study on the boron impurities in germanium crystal. AIP Conference Proceedings. Vol. 1566 American Institute of Physics Inc., 2013. pp. 41-42
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