TY - GEN
T1 - A linearity testing of cascaded analog mixed-signal blocks using SEIR method
AU - Ishikawa, Tatsuya
AU - Pai, Chia Wei
AU - Ishikuro, Hiroki
N1 - Publisher Copyright:
© 2020 IEEE.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2020/5
Y1 - 2020/5
N2 - This paper proposes a method to separate distortions of the input signal, amplifier, and analog-to-digital converter (ADC), which are cascaded blocks in the testing of an analog front-end system. The proposed technique extends the stimulus error identification and removal (SEIR) method to separate the low-quality input test signal, the nonlinearity of amplifier and ADC. The system model was built by using MATLAB/Simulink, and the nonlinearity of the input signal with distortion, amplifier, and ADC were successfully separated. With a 12-bit ADC, the estimation error of each block is less than 1 LSB in the simulation, and the proposed method was verified by measurement. The relations between the estimation error, calculation cost and each parameter in the proposed method are systematically studied.
AB - This paper proposes a method to separate distortions of the input signal, amplifier, and analog-to-digital converter (ADC), which are cascaded blocks in the testing of an analog front-end system. The proposed technique extends the stimulus error identification and removal (SEIR) method to separate the low-quality input test signal, the nonlinearity of amplifier and ADC. The system model was built by using MATLAB/Simulink, and the nonlinearity of the input signal with distortion, amplifier, and ADC were successfully separated. With a 12-bit ADC, the estimation error of each block is less than 1 LSB in the simulation, and the proposed method was verified by measurement. The relations between the estimation error, calculation cost and each parameter in the proposed method are systematically studied.
KW - ADC
KW - Analog-front-end
KW - Integral nonlinearity (INL)
KW - Stimulus error identification and removal (SEIR) method
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U2 - 10.1109/I2MTC43012.2020.9129113
DO - 10.1109/I2MTC43012.2020.9129113
M3 - Conference contribution
AN - SCOPUS:85088290825
T3 - I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings
BT - I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020
Y2 - 25 May 2020 through 29 May 2020
ER -