A low temperature scanning probe microscope using a quartz tuning fork

K. Saitoh, K. Hayashi, Y. Shibayama, Keiya Shirahama

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A frequency modulation-atomic force microscope (FM-AFM) designed to measure atomic scale topography at low temperatures is developed. Piezoelectric quartz tuning forks are employed as a force sensor for low temperatures use. In order to perform high-resolution measurements, detection of attractive forces between a tip and a sample is important. Measurements of attractive van der Waals forces on a SrTiO3 substrate is successfully performed down to 4.2 K by minimizing an amplitude of the tuning fork. Topographic imaging of atomic steps of the SrTiO3 substrate is also achieved at room temperatures in vacuum (10-3 Pa).

Original languageEnglish
Article number012039
JournalJournal of Physics: Conference Series
Volume150
DOIs
Publication statusPublished - 2009

Fingerprint

forks
quartz
tuning
microscopes
scanning
probes
Van der Waals forces
frequency modulation
topography
vacuum
high resolution
sensors
room temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

A low temperature scanning probe microscope using a quartz tuning fork. / Saitoh, K.; Hayashi, K.; Shibayama, Y.; Shirahama, Keiya.

In: Journal of Physics: Conference Series, Vol. 150, 012039, 2009.

Research output: Contribution to journalArticle

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