A method for calculating thermal radiation properties of multilayer films from optical constants

R. Horikoshi, Y. Nagasaka, A. Ohnishi

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

A calculation method for the incident angle dependence of the solar absorptance αs and the temperature dependence of the total hemispherical emittance εH of multilayer films is proposed. The method is based on calculation of αs and εH from optical constants in the wavelength region from 0.25 to 100 μm for thin polymer films and deposited metal. In this paper we provide values of αs in the incident angle region from 0 to 90° and εH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyamide film. The results obtained for as and εH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of αs and εH agree well with the experimental results.

Original languageEnglish
Pages (from-to)547-555
Number of pages9
JournalInternational Journal of Thermophysics
Volume19
Issue number2 SPEC.ISS.
DOIs
Publication statusPublished - 1998 Mar 1

Keywords

  • Multilayer films
  • Optical constants
  • Reflectance
  • Solar absorptance
  • Total hemispherical emittance

ASJC Scopus subject areas

  • Condensed Matter Physics

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