A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band

Kayhan Gutez, Nobuyoshi Mutoh, Fumio Harashima, Kouhei Ohnishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Predicting and solving EMI emissions related to Common Mode (CM) ones in pulse with modulation PWM inverter induction motor drive systems requires various jequency-ependent efects to be considered. Thus, the application of active circuitry to increase the peformance per size and prevent dependency on some parameters of the motorfor Electro-Magnetic Interference (EMI) filter IS considered. The major problems are power line jequency rejection and the compensation of the feedback loop, which is influenced by the wide-ranging utility impedance. While analysis and simulations show. in the literature, that these problems prevent the practical application of active filtering to power supplies especially less than 100 kHz, the approximation with artificial neural networks demonstrate a good promise to take into Ihe parameters of the mo(or impedancefor independence of the filter easily. Thus, the proposed method allows another way to prevent the switching "oise applying to the conducted electromagnetic emissions generally caused by power supply firstly to switching conditions, then secondly to common mode condition of the motor drive system.

Original languageEnglish
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
PublisherIEEE Computer Society
Pages1050-1055
Number of pages6
Volume1
DOIs
Publication statusPublished - 2000

Fingerprint

Backpropagation algorithms
Signal interference
Frequency bands
Neural networks
Pulse width modulation
Induction motors
Modulation
Feedback
Compensation and Redress

Keywords

  • Active filters
  • Circuits
  • Electromagnetic interference
  • Feedback loop
  • Frequency
  • Impedance
  • Induction motor drives
  • Power supplies
  • Pulse inverters
  • Pulse width modulation inverters

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Gutez, K., Mutoh, N., Harashima, F., & Ohnishi, K. (2000). A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band. In IECON Proceedings (Industrial Electronics Conference) (Vol. 1, pp. 1050-1055). [972268] IEEE Computer Society. https://doi.org/10.1109/IECON.2000.972268

A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band. / Gutez, Kayhan; Mutoh, Nobuyoshi; Harashima, Fumio; Ohnishi, Kouhei.

IECON Proceedings (Industrial Electronics Conference). Vol. 1 IEEE Computer Society, 2000. p. 1050-1055 972268.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gutez, K, Mutoh, N, Harashima, F & Ohnishi, K 2000, A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band. in IECON Proceedings (Industrial Electronics Conference). vol. 1, 972268, IEEE Computer Society, pp. 1050-1055. https://doi.org/10.1109/IECON.2000.972268
Gutez K, Mutoh N, Harashima F, Ohnishi K. A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band. In IECON Proceedings (Industrial Electronics Conference). Vol. 1. IEEE Computer Society. 2000. p. 1050-1055. 972268 https://doi.org/10.1109/IECON.2000.972268
Gutez, Kayhan ; Mutoh, Nobuyoshi ; Harashima, Fumio ; Ohnishi, Kouhei. / A new approach for determining the Common Mode (CM) impedance parameters of EMI emissions with the fast backpropagation algorithm of neural networks for low frequency band. IECON Proceedings (Industrial Electronics Conference). Vol. 1 IEEE Computer Society, 2000. pp. 1050-1055
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