A Parallel Algorithm for Allocation of Spare Cells on Memory Chips

Nobuo Funabiki, Yoshiyasu Takefuji

Research output: Contribution to journalArticlepeer-review


In manufacturing memory chips, Redundant Random Access Memory (RRAM) technology has been widely used because it not only provides repair of faulty cells but also enhances the production yield. RRAM has several rows and columns of spare memory cells which are used to replace the faulty cells. The goal of our algorithm is to find a spare allocation which repairs all the faulty cells in the given faulty-cell map. The parallel algorithm requires In processing elements for the n x n faulty-cell map problem. The algorithm is verified by many simulation runs. Under the simulation the algorithm finds one of the near-optimum solutions in a nearly constant time with 0(n) processors. The simulation results show the consistency of our algorithm. The algorithm can be easily extended for solving rectangular or other shapes of fault map problems. Reader Aids - Purpose: Present a new algorithm Special math needed for explanations: Probability Special math needed to use results: None Results useful to: Reliability theoreticians and analysts.

Original languageEnglish
Pages (from-to)338-346
Number of pages9
JournalIEEE Transactions on Reliability
Issue number3
Publication statusPublished - 1991 Aug
Externally publishedYes


  • Artificial neural network
  • Hysteresis McCulloch-Pitts neuron model
  • Parallel algorithm
  • Parallel computing
  • Spare allocation

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering


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