A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements

Uijin G. Jung, Kenta Kuwana, Yoshiharu Ajiki, Hidetoshi Takahashi, Tetsuo Kan, Yusuke Takei, Kentaro Noda, Eiji Iwase, Kiyoshi Matsumoto, Isao Shimoyama

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

Original languageEnglish
Article number045015
JournalJournal of Micromechanics and Microengineering
Volume23
Issue number4
DOIs
Publication statusPublished - 2013 Apr 1
Externally publishedYes

Fingerprint

Force measurement
Photoelectricity
Acoustic impedance
Microscopes
Fluorescence
Irradiation
Wavelength
Compensation and Redress

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements. / Jung, Uijin G.; Kuwana, Kenta; Ajiki, Yoshiharu; Takahashi, Hidetoshi; Kan, Tetsuo; Takei, Yusuke; Noda, Kentaro; Iwase, Eiji; Matsumoto, Kiyoshi; Shimoyama, Isao.

In: Journal of Micromechanics and Microengineering, Vol. 23, No. 4, 045015, 01.04.2013.

Research output: Contribution to journalArticle

Jung, Uijin G. ; Kuwana, Kenta ; Ajiki, Yoshiharu ; Takahashi, Hidetoshi ; Kan, Tetsuo ; Takei, Yusuke ; Noda, Kentaro ; Iwase, Eiji ; Matsumoto, Kiyoshi ; Shimoyama, Isao. / A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements. In: Journal of Micromechanics and Microengineering. 2013 ; Vol. 23, No. 4.
@article{fc719b56ea0d4cf58765992aa24d0321,
title = "A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements",
abstract = "This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87{\%}.",
author = "Jung, {Uijin G.} and Kenta Kuwana and Yoshiharu Ajiki and Hidetoshi Takahashi and Tetsuo Kan and Yusuke Takei and Kentaro Noda and Eiji Iwase and Kiyoshi Matsumoto and Isao Shimoyama",
year = "2013",
month = "4",
day = "1",
doi = "10.1088/0960-1317/23/4/045015",
language = "English",
volume = "23",
journal = "Journal of Micromechanics and Microengineering",
issn = "0960-1317",
publisher = "IOP Publishing Ltd.",
number = "4",

}

TY - JOUR

T1 - A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements

AU - Jung, Uijin G.

AU - Kuwana, Kenta

AU - Ajiki, Yoshiharu

AU - Takahashi, Hidetoshi

AU - Kan, Tetsuo

AU - Takei, Yusuke

AU - Noda, Kentaro

AU - Iwase, Eiji

AU - Matsumoto, Kiyoshi

AU - Shimoyama, Isao

PY - 2013/4/1

Y1 - 2013/4/1

N2 - This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

AB - This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

UR - http://www.scopus.com/inward/record.url?scp=84878092600&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84878092600&partnerID=8YFLogxK

U2 - 10.1088/0960-1317/23/4/045015

DO - 10.1088/0960-1317/23/4/045015

M3 - Article

VL - 23

JO - Journal of Micromechanics and Microengineering

JF - Journal of Micromechanics and Microengineering

SN - 0960-1317

IS - 4

M1 - 045015

ER -