A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach

Mitsuru Nakazawa, Masakazu Kobayashi, Hiroyuki Toda, Yoshimitsu Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.

Original languageEnglish
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
Pages1979-1984
Number of pages6
DOIs
Publication statusPublished - 2009
Event35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009 - Porto, Portugal
Duration: 2009 Nov 32009 Nov 5

Other

Other35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009
CountryPortugal
CityPorto
Period09/11/309/11/5

Fingerprint

Impurities
Cracks
Air

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Nakazawa, M., Kobayashi, M., Toda, H., & Aoki, Y. (2009). A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach. In IECON Proceedings (Industrial Electronics Conference) (pp. 1979-1984). [5414888] https://doi.org/10.1109/IECON.2009.5414888

A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach. / Nakazawa, Mitsuru; Kobayashi, Masakazu; Toda, Hiroyuki; Aoki, Yoshimitsu.

IECON Proceedings (Industrial Electronics Conference). 2009. p. 1979-1984 5414888.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakazawa, M, Kobayashi, M, Toda, H & Aoki, Y 2009, A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach. in IECON Proceedings (Industrial Electronics Conference)., 5414888, pp. 1979-1984, 35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009, Porto, Portugal, 09/11/3. https://doi.org/10.1109/IECON.2009.5414888
Nakazawa, Mitsuru ; Kobayashi, Masakazu ; Toda, Hiroyuki ; Aoki, Yoshimitsu. / A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach. IECON Proceedings (Industrial Electronics Conference). 2009. pp. 1979-1984
@inproceedings{05b31eac16074131a33c8661f742f53e,
title = "A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach",
abstract = "In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.",
author = "Mitsuru Nakazawa and Masakazu Kobayashi and Hiroyuki Toda and Yoshimitsu Aoki",
year = "2009",
doi = "10.1109/IECON.2009.5414888",
language = "English",
pages = "1979--1984",
booktitle = "IECON Proceedings (Industrial Electronics Conference)",

}

TY - GEN

T1 - A proposal of a method to analyze 3D deformation / fracture characteristics inside materials based on a stratified matching approach

AU - Nakazawa, Mitsuru

AU - Kobayashi, Masakazu

AU - Toda, Hiroyuki

AU - Aoki, Yoshimitsu

PY - 2009

Y1 - 2009

N2 - In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.

AB - In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.

UR - http://www.scopus.com/inward/record.url?scp=77951518836&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77951518836&partnerID=8YFLogxK

U2 - 10.1109/IECON.2009.5414888

DO - 10.1109/IECON.2009.5414888

M3 - Conference contribution

SP - 1979

EP - 1984

BT - IECON Proceedings (Industrial Electronics Conference)

ER -