Abstract
The reflected light intensity (IR) from the solid and liquid phases of Ge-Sb-Te alloy has been statically measured, IR rapidly decreased after crossing the melting point during the heating process, and increased to its initial intensity level after solidifying during the cooling process. A special sample preparation technique using a quartz cell enabled reliable measurements to be carried out. The structure and composition of the Ge-Sb-Te alloy was investigated using Raman scattering and X-ray fluorescence after the melting process. Germanium was found to preferentially diffuse from the bulk to the surface leading to a germanium oxide surface phase.
Original language | English |
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Pages (from-to) | L868-L870 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 46 |
Issue number | 36-40 |
DOIs | |
Publication status | Published - 2007 Oct 12 |
Externally published | Yes |
Keywords
- Ge-Sb-Te alloy
- Melting point
- Optical disk
- Reflected light intensity
- Static measurement
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)