A root cause analysis method using dual vee model for cause identification reliability improvement

Hironori Maejima, Naohiko Kohtake, Yoshiaki Ohkami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Root cause analysis (RCA) of complex systems is important for identify countermeasures. Fault tree analysis (FTA) is one of the most commonly used tools for RCA. However FTA provides less guidance to analysts. Therefore it is difficult for them to exhaustively identify possible causes, and analysis results strongly depend on their skills. Spacecraft systems are among the largest and most complex man-made systems and consequently require the application of systems engineering methods in their development processes. Spacecraft development is particularly difficult because spacecraft operate in a low gravity and high vacuum environment, which make realistic system level tests impossible on earth before launch. For this reason, it is common that design and manufacture are complementarily verified by analysis. However, insufficient verification often results in on-orbit nonconformance, leading to unexpected anomalies in mission operations. This study proposes the use of the Dual Vee Model developed in recent advances on strategic systems engineering methodology for identifying the root cause of such anomalies. The proposed method facilitates exhaustive identification of possible causes. The usefulness of this approach has been demonstrated in the ADEOS-II spacecraft which is a three-ton class Japanese Earth-observing satellite. The Dual Vee Model consisting of the Architecture Vee and the Entity Vee is helpful in identifying the configuration items and the development sequence for determining the process that could have caused an anomaly.

Original languageEnglish
Title of host publication22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012
Pages1396-1410
Number of pages15
Publication statusPublished - 2012 Dec 1
Event22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012 - Rome, Italy
Duration: 2012 Jul 92012 Jul 12

Publication series

Name22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012
Volume2

Other

Other22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012
CountryItaly
CityRome
Period12/7/912/7/12

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Information Systems
  • Control and Systems Engineering

Cite this

Maejima, H., Kohtake, N., & Ohkami, Y. (2012). A root cause analysis method using dual vee model for cause identification reliability improvement. In 22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012 (pp. 1396-1410). (22nd Annual International Symposium of the International Council on Systems Engineering, INCOSE 2012 and the 8th Biennial European Systems Engineering Conference 2012, EuSEC 2012; Vol. 2).