A soft X-ray beamline for surface chemistry at the Photon Factory

Kenta Amemiya, Hiroshi Kondoh, Toshihiko Yokoyama, Toshiaki Ohta

Research output: Contribution to journalArticle

77 Citations (Scopus)

Abstract

A new soft X-ray (50-1500 eV) beamline has been constructed at a bending magnet station at the Photon Factory in order to perform photoemission spectroscopy (PES), X-ray absorption fine structure (XAFS), photoelectron diffraction (PED) and X-ray magnetic circular dichroism (XMCD) experiments in surface chemistry. Approximately 1011 photons/s can be obtained with a medium resolution (E/ΔE∼1000), while E/ΔE∼8000 can be attained at the N K edge with a photon flux of ∼109 photons/s. In addition to conventional XAFS, a novel technique 'energy dispersive NEXAFS (near-edge X-ray absorption fine structure)' has been successfully developed. The performance of the new beamline is reported and typical examples of its application to surface chemistry are demonstrated.

Original languageEnglish
Pages (from-to)151-164
Number of pages14
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume124
Issue number2-3
DOIs
Publication statusPublished - 2002 Jul 1
Externally publishedYes

Keywords

  • Energy dispersive NEXAFS
  • Soft X-ray beamline
  • Surface chemistry
  • X-Ray absorption fine structure (XAFS)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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