A topological phase buried in a chalcogenide superlattice monitored by a helicity dependent Kerr measurement

Chalcogenide superlattices (SL), formed by the alternate stacking of GeTe and Sb2Te3 layers, also referred to as interfacial phase change memory (iPCM), are a leading candidate for spin based memory device applications. Theoretically, the iPCM structure it has been predicted to form a 3D topological insulator or Dirac semimetal depending on the constituent layer thicknesses. Here, we experimentally investigate the topological insulating nature of chalcogenide SLs using a helicity dependent time-resolved Kerr measurement. The helicity dependent Kerr signal is observed to exhibit a four cycle oscillation with π/2 periodicity suggesting the existence of a Dirac-like cone in some chalcogenide SLs. Furthermore, we found that increasing the thickness of the GeTe layer dramatically changes the periodicity, indicating a phase transition from a Dirac semimetal into a trivial insulator. Our results demonstrate that thickness-tuned chalcogenide SLs can play an important role in the manipulation of topological states, which may open up new possibilities for spintronic devices based on chalcogenide SLs.