Aberration of a negative ion beam caused by space charge effect

K. Miyamoto, S. Wada, Akiyoshi Hatayama

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Aberrations are inevitable when the charged particle beams are extracted, accelerated, transmitted, and focused with electrostatic and magnetic fields. In this study, we investigate the aberration of a negative ion accelerator for a neutral beam injector theoretically, especially the spherical aberration caused by the negative ion beam expansion due to the space charge effect. The negative ion current density profiles with the spherical aberration are compared with those without the spherical aberration. It is found that the negative ion current density profiles in a log scale are tailed due to the spherical aberration.

Original languageEnglish
Article number02A724
JournalReview of Scientific Instruments
Volume81
Issue number2
DOIs
Publication statusPublished - 2010

Fingerprint

Aberrations
Electric space charge
negative ions
Ion beams
aberration
space charge
Negative ions
ion beams
ion currents
Current density
current density
ion accelerators
Particle beams
neutral beams
particle beams
Charged particles
profiles
injectors
Particle accelerators
charged particles

ASJC Scopus subject areas

  • Instrumentation

Cite this

Aberration of a negative ion beam caused by space charge effect. / Miyamoto, K.; Wada, S.; Hatayama, Akiyoshi.

In: Review of Scientific Instruments, Vol. 81, No. 2, 02A724, 2010.

Research output: Contribution to journalArticle

Miyamoto, K. ; Wada, S. ; Hatayama, Akiyoshi. / Aberration of a negative ion beam caused by space charge effect. In: Review of Scientific Instruments. 2010 ; Vol. 81, No. 2.
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