Accurate Monte Carlo modeling of terminal currents in short semiconductor devices by using a generalized Ramo-Shockley theorem

P. Houlet, Yuji Awano, N. Yokoyama, C. Hamaguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The authors present an efficient and simple method using a generalized formulation of the Ramo-Shockley theorem for the calculation of the time-dependent terminal currents in multi-port devices within the ensemble Monte Carlo modeling, including the displacement current and the separate contribution of each particle type. Moreover, our technique is optimized for the cloud-in-cell and box integration framework. We emphasize that our formulation does not require any additional optimization theory, is easy to implement and does not increase CPU time consumption.

Original languageEnglish
Title of host publicationExtended Abstracts of 1998 6th International Workshop on Computational Electronics, IWCE 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages218-221
Number of pages4
Volume1998-October
ISBN (Electronic)0780343697, 9780780343696
DOIs
Publication statusPublished - 1998 Jan 1
Externally publishedYes
Event6th International Workshop on Computational Electronics, IWCE 1998 - Osaka, Japan
Duration: 1998 Oct 191998 Oct 21

Other

Other6th International Workshop on Computational Electronics, IWCE 1998
CountryJapan
CityOsaka
Period98/10/1998/10/21

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ASJC Scopus subject areas

  • Modelling and Simulation
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Mathematical Physics

Cite this

Houlet, P., Awano, Y., Yokoyama, N., & Hamaguchi, C. (1998). Accurate Monte Carlo modeling of terminal currents in short semiconductor devices by using a generalized Ramo-Shockley theorem. In Extended Abstracts of 1998 6th International Workshop on Computational Electronics, IWCE 1998 (Vol. 1998-October, pp. 218-221). [742751] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWCE.1998.742751