An analysis on force data during biopsy insertion

Daiki Suzuki, Yoshitomo Matsumi, Kouhei Ohnishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, an analysis on force data during needle insertion for biopsy is conducted. The analysis proposes a novel way of assessing the organ stiffness. During the biopsy operation, the force data is recorded by constructing reaction force observer (RFOB) without utilizing force sensors. The recorded force data is then treated in the force modeling equation of needle insertion movements. Finally, the quantitative stiffness assessment method is presented. This paper utilizes the force modeling into three phases, which are contact, puncture, and pierce phases. The analysis to model the force data for each tissue inside the content is conducted. The analysis is discussed to evaluate the stiffness of three different environments which all imitate the liver.

Original languageEnglish
Title of host publication2014 IEEE 13th International Workshop on Advanced Motion Control, AMC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages422-427
Number of pages6
ISBN (Print)9781479923243
DOIs
Publication statusPublished - 2014 Jan 1
Event2014 13th IEEE International Workshop on Advanced Motion Control, AMC 2014 - Yokohama, Japan
Duration: 2014 Mar 142014 Mar 16

Publication series

NameInternational Workshop on Advanced Motion Control, AMC

Other

Other2014 13th IEEE International Workshop on Advanced Motion Control, AMC 2014
CountryJapan
CityYokohama
Period14/3/1414/3/16

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ASJC Scopus subject areas

  • Control and Systems Engineering
  • Modelling and Simulation
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Suzuki, D., Matsumi, Y., & Ohnishi, K. (2014). An analysis on force data during biopsy insertion. In 2014 IEEE 13th International Workshop on Advanced Motion Control, AMC 2014 (pp. 422-427). [6823319] (International Workshop on Advanced Motion Control, AMC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AMC.2014.6823319