Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto, So Hasegawa, Yusuke Kiuchi, Atsutake Kosuge, Tadahiro Kuroda

Research output: Contribution to journalArticle

Abstract

This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

Original languageEnglish
Pages (from-to)659-662
Number of pages4
JournalIEICE Transactions on Electronics
VolumeE99C
Issue number6
DOIs
Publication statusPublished - 2016 Jun 1

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Variable frequency oscillators
Signal interference
System-on-chip

Keywords

  • 3D integration
  • EMI
  • LC-VCO
  • TCI

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO. / Kadomoto, Junichiro; Hasegawa, So; Kiuchi, Yusuke; Kosuge, Atsutake; Kuroda, Tadahiro.

In: IEICE Transactions on Electronics, Vol. E99C, No. 6, 01.06.2016, p. 659-662.

Research output: Contribution to journalArticle

Kadomoto, Junichiro ; Hasegawa, So ; Kiuchi, Yusuke ; Kosuge, Atsutake ; Kuroda, Tadahiro. / Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO. In: IEICE Transactions on Electronics. 2016 ; Vol. E99C, No. 6. pp. 659-662.
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