Analysis and evaluation of electromagnetic interference between ThruChip interface and LC-VCO

Junichiro Kadomoto, So Hasegawa, Yusuke Kiuchi, Atsutake Kosuge, Tadahiro Kuroda

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

    Original languageEnglish
    Pages (from-to)659-662
    Number of pages4
    JournalIEICE Transactions on Electronics
    VolumeE99C
    Issue number6
    DOIs
    Publication statusPublished - 2016 Jun 1

    Keywords

    • 3D integration
    • EMI
    • LC-VCO
    • TCI

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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