Analysis of Electric Properties of Chemically Adsorbed Multilayers on Solid Substrates

Norihisa Mino; Kazufumi Ogawa; Motoyoshi Hatada; Masahiro Takatsuka; Seimei Sha; Toyosaka Moriizumi

doi:10.1021/la00029a021

Analysis of Electric Properties of Chemically Adsorbed Multilayers on Solid Substrates

Norihisa Mino, Kazufumi Ogawa, Motoyoshi Hatada, Masahiro Takatsuka, Seimei Sha, Toyosaka Moriizumi

Research output: Contribution to journal › Article

3 Citations (Scopus)

Abstract

Oriented multilayers were prepared from a chlorosilyl-type surfactant of 18-nonadecyltrichlorosilane (CH₂CH(CH₂)₁₇SiCl₃′ V-NTS) by repeated cycles of a chemical adsorption (CA) process and an electron beam irradiation (EB) process in an active gas atmosphere. Properties of the multilayers were studied by ellipsometry and current-voltage (I–V) measurement as a function of number of CA-EB cycles, n. The thickness of the CA multilayers as measured by ellipsometry increased with increasing n and reached a constant value, indicating that film material was lost by radiation damage during the EB process. For a CA monolayer and a CA multilayer obtained by 5 CA-EB cycles, the current did not obey the Ohmic law in the potential region up to 10⁸ V/m but was governed by the space charge limited current (SCLC) law, while for those with 10 through 40 CA-EB cycles, the current obeys the Ohmic law in the same potential region, and then the SCLC law above 1 × 10⁸ V/m. The breakdown voltage determined from J-E curves was found to be independent of CA film thickness.

Original language	English
Pages (from-to)	1280-1283
Number of pages	4
Journal	Langmuir
Volume	9
Issue number	5
DOIs	https://doi.org/10.1021/la00029a021
Publication status	Published - 1993 Jan 1
Externally published	Yes

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ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

Cite this

Mino, N., Ogawa, K., Hatada, M., Takatsuka, M., Sha, S., & Moriizumi, T. (1993). Analysis of Electric Properties of Chemically Adsorbed Multilayers on Solid Substrates. Langmuir, 9(5), 1280-1283. https://doi.org/10.1021/la00029a021

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title = "Analysis of Electric Properties of Chemically Adsorbed Multilayers on Solid Substrates",

abstract = "Oriented multilayers were prepared from a chlorosilyl-type surfactant of 18-nonadecyltrichlorosilane (CH2CH(CH2)17SiCl3′ V-NTS) by repeated cycles of a chemical adsorption (CA) process and an electron beam irradiation (EB) process in an active gas atmosphere. Properties of the multilayers were studied by ellipsometry and current-voltage (I–V) measurement as a function of number of CA-EB cycles, n. The thickness of the CA multilayers as measured by ellipsometry increased with increasing n and reached a constant value, indicating that film material was lost by radiation damage during the EB process. For a CA monolayer and a CA multilayer obtained by 5 CA-EB cycles, the current did not obey the Ohmic law in the potential region up to 108 V/m but was governed by the space charge limited current (SCLC) law, while for those with 10 through 40 CA-EB cycles, the current obeys the Ohmic law in the same potential region, and then the SCLC law above 1 × 108 V/m. The breakdown voltage determined from J-E curves was found to be independent of CA film thickness.",

author = "Norihisa Mino and Kazufumi Ogawa and Motoyoshi Hatada and Masahiro Takatsuka and Seimei Sha and Toyosaka Moriizumi",

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AU - Moriizumi, Toyosaka

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N2 - Oriented multilayers were prepared from a chlorosilyl-type surfactant of 18-nonadecyltrichlorosilane (CH2CH(CH2)17SiCl3′ V-NTS) by repeated cycles of a chemical adsorption (CA) process and an electron beam irradiation (EB) process in an active gas atmosphere. Properties of the multilayers were studied by ellipsometry and current-voltage (I–V) measurement as a function of number of CA-EB cycles, n. The thickness of the CA multilayers as measured by ellipsometry increased with increasing n and reached a constant value, indicating that film material was lost by radiation damage during the EB process. For a CA monolayer and a CA multilayer obtained by 5 CA-EB cycles, the current did not obey the Ohmic law in the potential region up to 108 V/m but was governed by the space charge limited current (SCLC) law, while for those with 10 through 40 CA-EB cycles, the current obeys the Ohmic law in the same potential region, and then the SCLC law above 1 × 108 V/m. The breakdown voltage determined from J-E curves was found to be independent of CA film thickness.

AB - Oriented multilayers were prepared from a chlorosilyl-type surfactant of 18-nonadecyltrichlorosilane (CH2CH(CH2)17SiCl3′ V-NTS) by repeated cycles of a chemical adsorption (CA) process and an electron beam irradiation (EB) process in an active gas atmosphere. Properties of the multilayers were studied by ellipsometry and current-voltage (I–V) measurement as a function of number of CA-EB cycles, n. The thickness of the CA multilayers as measured by ellipsometry increased with increasing n and reached a constant value, indicating that film material was lost by radiation damage during the EB process. For a CA monolayer and a CA multilayer obtained by 5 CA-EB cycles, the current did not obey the Ohmic law in the potential region up to 108 V/m but was governed by the space charge limited current (SCLC) law, while for those with 10 through 40 CA-EB cycles, the current obeys the Ohmic law in the same potential region, and then the SCLC law above 1 × 108 V/m. The breakdown voltage determined from J-E curves was found to be independent of CA film thickness.

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Access to Document

10.1021/la00029a021