Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources

S. Fujita; T. Yamamoto; M. Yoshida; M. Onai; A. Kojima; A. Hatayama; M. Kashiwagi

doi:10.1063/1.4995761

Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources

S. Fujita, T. Yamamoto, M. Yoshida, M. Onai, A. Kojima, A. Hatayama, M. Kashiwagi

Department of Applied Physics and Physico-Informatics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

In order to improve the uniformity of the negative ion production, the KEIO-MARC code has been applied to the QST's JT60SA negative ion source in three different magnetic configurations (i) MC-PGMF (Multi-Cusp and PG Magnetic Filter), (ii) TNT-MF (TeNT Magnetic Filter) and (iii) MTNT-MF (Modified TeNT Magnetic Filter). From the results, we have confirmed that the electron rotation inside the negative ion source is an essential element in order to obtain a uniform production of the negative ions. By adding extra tent magnets on the longitudinal sides, the electron rotation has been enhanced, and a uniform production of negative ions has been realized.

Original language	English
Title of host publication	5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016
Editors	Dan Faircloth
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735415492
DOIs	https://doi.org/10.1063/1.4995761
Publication status	Published - 2017 Aug 9
Event	5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016 - Oxford, United Kingdom Duration: 2016 Sep 12 → 2016 Sep 16

Publication series

Name	AIP Conference Proceedings
Volume	1869
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016
Country	United Kingdom
City	Oxford
Period	16/9/12 → 16/9/16

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.4995761

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Cite this

Fujita, S., Yamamoto, T., Yoshida, M., Onai, M., Kojima, A., Hatayama, A., & Kashiwagi, M. (2017). Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources. In D. Faircloth (Ed.), 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016 [030041] (AIP Conference Proceedings; Vol. 1869). American Institute of Physics Inc.. https://doi.org/10.1063/1.4995761

Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources. / Fujita, S.; Yamamoto, T.; Yoshida, M.; Onai, M.; Kojima, A.; Hatayama, A.; Kashiwagi, M.

5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016. ed. / Dan Faircloth. American Institute of Physics Inc., 2017. 030041 (AIP Conference Proceedings; Vol. 1869).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fujita, S, Yamamoto, T, Yoshida, M, Onai, M, Kojima, A, Hatayama, A & Kashiwagi, M 2017, Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources. in D Faircloth (ed.), 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016., 030041, AIP Conference Proceedings, vol. 1869, American Institute of Physics Inc., 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016, Oxford, United Kingdom, 16/9/12. https://doi.org/10.1063/1.4995761

Fujita S, Yamamoto T, Yoshida M, Onai M, Kojima A, Hatayama A et al. Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources. In Faircloth D, editor, 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016. American Institute of Physics Inc. 2017. 030041. (AIP Conference Proceedings). https://doi.org/10.1063/1.4995761

Fujita, S. ; Yamamoto, T. ; Yoshida, M. ; Onai, M. ; Kojima, A. ; Hatayama, A. ; Kashiwagi, M. / Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources. 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016. editor / Dan Faircloth. American Institute of Physics Inc., 2017. (AIP Conference Proceedings).

@inproceedings{71b42ac1a0f74eada69979208b754bb0,

title = "Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources",

abstract = "In order to improve the uniformity of the negative ion production, the KEIO-MARC code has been applied to the QST's JT60SA negative ion source in three different magnetic configurations (i) MC-PGMF (Multi-Cusp and PG Magnetic Filter), (ii) TNT-MF (TeNT Magnetic Filter) and (iii) MTNT-MF (Modified TeNT Magnetic Filter). From the results, we have confirmed that the electron rotation inside the negative ion source is an essential element in order to obtain a uniform production of the negative ions. By adding extra tent magnets on the longitudinal sides, the electron rotation has been enhanced, and a uniform production of negative ions has been realized.",

author = "S. Fujita and T. Yamamoto and M. Yoshida and M. Onai and A. Kojima and A. Hatayama and M. Kashiwagi",

year = "2017",

month = aug,

day = "9",

doi = "10.1063/1.4995761",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

editor = "Dan Faircloth",

booktitle = "5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016",

}

TY - GEN

T1 - Analysis of the spatial non-uniformity of negative ion production in surface-produced negative ion sources

AU - Fujita, S.

AU - Yamamoto, T.

AU - Yoshida, M.

AU - Onai, M.

AU - Kojima, A.

AU - Hatayama, A.

AU - Kashiwagi, M.

PY - 2017/8/9

Y1 - 2017/8/9

N2 - In order to improve the uniformity of the negative ion production, the KEIO-MARC code has been applied to the QST's JT60SA negative ion source in three different magnetic configurations (i) MC-PGMF (Multi-Cusp and PG Magnetic Filter), (ii) TNT-MF (TeNT Magnetic Filter) and (iii) MTNT-MF (Modified TeNT Magnetic Filter). From the results, we have confirmed that the electron rotation inside the negative ion source is an essential element in order to obtain a uniform production of the negative ions. By adding extra tent magnets on the longitudinal sides, the electron rotation has been enhanced, and a uniform production of negative ions has been realized.

AB - In order to improve the uniformity of the negative ion production, the KEIO-MARC code has been applied to the QST's JT60SA negative ion source in three different magnetic configurations (i) MC-PGMF (Multi-Cusp and PG Magnetic Filter), (ii) TNT-MF (TeNT Magnetic Filter) and (iii) MTNT-MF (Modified TeNT Magnetic Filter). From the results, we have confirmed that the electron rotation inside the negative ion source is an essential element in order to obtain a uniform production of the negative ions. By adding extra tent magnets on the longitudinal sides, the electron rotation has been enhanced, and a uniform production of negative ions has been realized.

UR - http://www.scopus.com/inward/record.url?scp=85030128560&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85030128560&partnerID=8YFLogxK

U2 - 10.1063/1.4995761

DO - 10.1063/1.4995761

M3 - Conference contribution

AN - SCOPUS:85030128560

T3 - AIP Conference Proceedings

BT - 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016

A2 - Faircloth, Dan

PB - American Institute of Physics Inc.

T2 - 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016

Y2 - 12 September 2016 through 16 September 2016

ER -