Analyte-selective optode membranes and optical evaluation techniques: characterization of response behavior by ATR measurements

Ursula E. Spichiger-Keller, D. Citterio, M. Bott

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

A variety of analyte-selective bulk membranes for use in optodes have been developed. They combine effectively with various optical transducers and detection techniques. Although the working principles of these membranes differ, the basic principle is a diffusion-limited exchange of the analyte between sample solution and optical bulk membrane. The thickness and viscosity of the membranes govern the diffusion and, therefore, the response time of the sensor. In accord with analytical requirements, the specifications of optode membranes can be predicted from measurements of the overall diffusion coefficients in the membrane phase. The ATR-approach is shown to be an attractive technique for such investigations.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages179-189
Number of pages11
Publication statusPublished - 1995 Dec 1
Externally publishedYes
EventChemical, Biochemical, and Environmental Fiber Sensors VII - Munich, Ger
Duration: 1995 Jun 191995 Jun 20

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2508
ISSN (Print)0277-786X

Other

OtherChemical, Biochemical, and Environmental Fiber Sensors VII
CityMunich, Ger
Period95/6/1995/6/20

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Spichiger-Keller, U. E., Citterio, D., & Bott, M. (1995). Analyte-selective optode membranes and optical evaluation techniques: characterization of response behavior by ATR measurements. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 179-189). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2508).