Analytical evaluation of coverage probability in two-tier cognitive femto networks

Fereidoun H. Panahi, Tomoaki Ohtsuki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a cognitive radio (CR) based statistical framework for a two-tier (femto- macro) heterogeneous cellular network. In this framework, the coverage probability of an arbitrary femto user is determined. Using tools from stochastic geometry and point process theory (in this paper, the spatial Poisson point process (PPP) theory is used) we model the random locations and topology of both the femto and macro networks. A considerable improvement of system performance can be generally achieved by mitigating interference, as a result of applying the CR idea over the above model. We also study the implication of a Reinforcement Learning (RL) based power control (PC) strategy per femto user in interference-limited networks over the above model to guarantee a certain value of coverage probability for a given signal-to-interference- plus-noise-ratio (SINR) target

Original languageEnglish
Title of host publicationIEEE Vehicular Technology Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-July
ISBN (Print)9781479980888
DOIs
Publication statusPublished - 2015 Jul 1
Event81st IEEE Vehicular Technology Conference, VTC Spring 2015 - Glasgow, United Kingdom
Duration: 2015 May 112015 May 14

Other

Other81st IEEE Vehicular Technology Conference, VTC Spring 2015
CountryUnited Kingdom
CityGlasgow
Period15/5/1115/5/14

Keywords

  • Cognitive radio (CR)
  • Poisson point process (PPP)
  • Power control (PC)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Applied Mathematics

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  • Cite this

    Panahi, F. H., & Ohtsuki, T. (2015). Analytical evaluation of coverage probability in two-tier cognitive femto networks. In IEEE Vehicular Technology Conference (Vol. 2015-July). [7145703] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCSpring.2015.7145703