Assessment of liquid crystal display image defects by pixel capacitance measurement based on electrical model for panel design

Yasuhiro Miyake, Atsuto Ota, Hidekazu Nishimura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This article proposes the assessment of liquid crystal display (LCD) image defects based on electrical models which are also used for the design of liquid crystal (LC) cell panels. The effects of image defects on a LC pixel electrical model are analyzed, and the test method for assessing image defects using the electrical model is provided. Experimental results show the validity of the analysis and effectiveness of the proposed test method.

Original languageEnglish
Title of host publicationEuroDisplay 2015
PublisherBlackwell Publishing Ltd
Pages71
Number of pages1
Volume46
ISBN (Electronic)9781510833104
Publication statusPublished - 2015
EventEuroDisplay 2015 Conference - Ghent, Belgium
Duration: 2015 Sep 212015 Sep 23

Other

OtherEuroDisplay 2015 Conference
CountryBelgium
CityGhent
Period15/9/2115/9/23

ASJC Scopus subject areas

  • Engineering(all)

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