Barkhausen-like behavior in reentrant spin glass NiMn/Cu/Ni trilayer film

T. Ogawa, H. Nagasaki, Tetsuya Sato

Research output: Contribution to journalArticle

Abstract

The mechanism of magnetization reversal in the RSG phase of NiMn layer in NiMn/Cu/Ni trilayer films, with different Cu spacer thickness, has been studied in relation with the domain structure based on the Barkhausen process. The analysis of the time dependent magnetization suggests that the dynamics of small regime, on nanoscale, governs the magnetization reversal process at smaller amplitude of magnetic field. As the amplitude of applied field increases, the macroscopic dynamics, related to the domain wall motion, replaces the microscopic dynamics. Thus, the two stages of magnetization reversal characterize the magnetization process of RSG phase of NiMn thin film.

Original languageEnglish
Pages (from-to)1019-1022
Number of pages4
JournalPhysica Status Solidi (A) Applied Research
Volume189
Issue number3
DOIs
Publication statusPublished - 2002 Feb

Fingerprint

Magnetization reversal
Spin glass
spin glass
magnetization
Magnetization
Domain walls
Magnetic fields
Thin films
spacers
domain wall
thin films
magnetic fields

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Barkhausen-like behavior in reentrant spin glass NiMn/Cu/Ni trilayer film. / Ogawa, T.; Nagasaki, H.; Sato, Tetsuya.

In: Physica Status Solidi (A) Applied Research, Vol. 189, No. 3, 02.2002, p. 1019-1022.

Research output: Contribution to journalArticle

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