Bayes estimator of process capability index Cpk  with a specified prior mean

Shun Matsuura

doi:10.1080/03610926.2021.1947508

Bayes estimator of process capability index C_pk with a specified prior mean

Shun Matsuura

Department of Industrial and Systems Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Process capability indices such as C_p, C_pL, C_pU, and C_pk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of C_pk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

Original language	English
Journal	Communications in Statistics - Theory and Methods
DOIs	https://doi.org/10.1080/03610926.2021.1947508
Publication status	Accepted/In press - 2021

Keywords

Bayes estimator
process capability index
statistical quality control

ASJC Scopus subject areas

Statistics and Probability

Access to Document

10.1080/03610926.2021.1947508

Cite this

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abstract = "Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.",

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