TY - JOUR
T1 - Bayes estimator of process capability index Cpk with a specified prior mean
AU - Matsuura, Shun
N1 - Publisher Copyright:
© 2021 Taylor & Francis Group, LLC.
PY - 2021
Y1 - 2021
N2 - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.
AB - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.
KW - Bayes estimator
KW - process capability index
KW - statistical quality control
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U2 - 10.1080/03610926.2021.1947508
DO - 10.1080/03610926.2021.1947508
M3 - Article
AN - SCOPUS:85109659005
JO - Communications in Statistics - Theory and Methods
JF - Communications in Statistics - Theory and Methods
SN - 0361-0926
ER -