Bayes estimator of process capability index Cpk  with a specified prior mean

Shun Matsuura

doi:10.1080/03610926.2021.1947508

Bayes estimator of process capability index C_pk with a specified prior mean

Shun Matsuura

Department of Industrial and Systems Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Process capability indices such as C_p, C_pL, C_pU, and C_pk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of C_pk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

Original language	English
Journal	Communications in Statistics - Theory and Methods
DOIs	https://doi.org/10.1080/03610926.2021.1947508
Publication status	Accepted/In press - 2021

Keywords

Bayes estimator
process capability index
statistical quality control

ASJC Scopus subject areas

Statistics and Probability

Access to Document

10.1080/03610926.2021.1947508

Cite this

@article{b7f199772bf14523ab8780cb0a23c257,

title = "Bayes estimator of process capability index Cpk with a specified prior mean",

abstract = "Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.",

keywords = "Bayes estimator, process capability index, statistical quality control",

author = "Shun Matsuura",

note = "Publisher Copyright: {\textcopyright} 2021 Taylor & Francis Group, LLC.",

year = "2021",

doi = "10.1080/03610926.2021.1947508",

language = "English",

journal = "Communications in Statistics - Theory and Methods",

issn = "0361-0926",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - Bayes estimator of process capability index Cpk with a specified prior mean

AU - Matsuura, Shun

PY - 2021

Y1 - 2021

N2 - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

AB - Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

KW - Bayes estimator

KW - process capability index

KW - statistical quality control

UR - http://www.scopus.com/inward/record.url?scp=85109659005&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85109659005&partnerID=8YFLogxK

U2 - 10.1080/03610926.2021.1947508

DO - 10.1080/03610926.2021.1947508

M3 - Article

AN - SCOPUS:85109659005

JO - Communications in Statistics - Theory and Methods

JF - Communications in Statistics - Theory and Methods

SN - 0361-0926

ER -