Bayes estimator of process capability index Cpk with a specified prior mean

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Abstract

Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

Original languageEnglish
JournalCommunications in Statistics - Theory and Methods
DOIs
Publication statusAccepted/In press - 2021

Keywords

  • Bayes estimator
  • process capability index
  • statistical quality control

ASJC Scopus subject areas

  • Statistics and Probability

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