Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy

Fumihiko Kannari, Keiichiro Matsuishi, Takuya Harada, Jun Ohi, Yu Oishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We apply two nova methods, a spectral interferometry with NSOM, and fringe-resolved-autocorrelation with dark-field microscopy in the spatio-temporal characterization of femtosecond localized plasmon at metal nanostructures. Spatio-temporal plasmon control is studied using these diagnostics.

Original languageEnglish
Title of host publicationEuropean Conference on Optical Communication, ECOC
Volume1-2
DOIs
Publication statusPublished - 2010
Event36th European Conference and Exhibition on Optical Communication, ECOC 2010 - Torino, Italy
Duration: 2010 Sep 192010 Sep 23

Other

Other36th European Conference and Exhibition on Optical Communication, ECOC 2010
CountryItaly
CityTorino
Period10/9/1910/9/23

Fingerprint

Near field scanning optical microscopy
Autocorrelation
Interferometry
Nanostructures
Microscopic examination
Metals

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy. / Kannari, Fumihiko; Matsuishi, Keiichiro; Harada, Takuya; Ohi, Jun; Oishi, Yu.

European Conference on Optical Communication, ECOC. Vol. 1-2 2010. 5621113.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kannari, F, Matsuishi, K, Harada, T, Ohi, J & Oishi, Y 2010, Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy. in European Conference on Optical Communication, ECOC. vol. 1-2, 5621113, 36th European Conference and Exhibition on Optical Communication, ECOC 2010, Torino, Italy, 10/9/19. https://doi.org/10.1109/ECOC.2010.5621113
Kannari, Fumihiko ; Matsuishi, Keiichiro ; Harada, Takuya ; Ohi, Jun ; Oishi, Yu. / Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy. European Conference on Optical Communication, ECOC. Vol. 1-2 2010.
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