Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy

Fumihiko Kannari, Keiichiro Matsuishi, Takuya Harada, Jun Ohi, Yu Oishi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    We apply two nova methods, a spectral interferometry with NSOM, and fringe-resolved-autocorrelation with dark-field microscopy in the spatio-temporal characterization of femtosecond localized plasmon at metal nanostructures. Spatio-temporal plasmon control is studied using these diagnostics.

    Original languageEnglish
    Title of host publicationECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings
    DOIs
    Publication statusPublished - 2010 Dec 31
    Event36th European Conference and Exhibition on Optical Communication, ECOC 2010 - Torino, Italy
    Duration: 2010 Sep 192010 Sep 23

    Publication series

    NameEuropean Conference on Optical Communication, ECOC
    Volume1-2

    Other

    Other36th European Conference and Exhibition on Optical Communication, ECOC 2010
    CountryItaly
    CityTorino
    Period10/9/1910/9/23

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials

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  • Cite this

    Kannari, F., Matsuishi, K., Harada, T., Ohi, J., & Oishi, Y. (2010). Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy. In ECOC 2010 - 36th European Conference and Exhibition on Optical Communication, Proceedings [5621113] (European Conference on Optical Communication, ECOC; Vol. 1-2). https://doi.org/10.1109/ECOC.2010.5621113