Coulomb blockade effects in edge quantum wire SOI MOSFETs

Akiko Ohata, Akira Toriumi, Ken Uchida

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Edge quantum wire MOSFETs were fabricated using the sidewall of an ultrathin SOI, and the electrical characteristics were investigated. In this device, current oscillations for gate voltage sweeping were clearly observed at 4.2 K. This effect is considered from the viewpoint of the Coulomb oscillations in the multijunction system on the edge quantum wire. Furthermore, we focus on two concerns regarding the application of the single electron tunneling (SET) devices. One concern is the phase instability of the Coulomb oscillations due to trapped or floating charges around the SET devices. To overcome this problem, we propose a double-gate edge SOI MOSFET. In fact, it is experimentally confirmed that the Coulomb oscillation phase is tunable. The other concern is the low driving capability of SET devices. To improve this, it has also been experimentally demonstrated that the direct transmission of SET signals to the conventional MOSFET current is possible. This means that the output impedance can be transformed locally or globally from high to low in the SET-device circuits hybridized with CMOS devices.

Original languageEnglish
Pages (from-to)1686-1689
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume36
Issue number3 SUPPL. B
Publication statusPublished - 1997 Mar
Externally publishedYes

Fingerprint

Coulomb blockade
Semiconductor quantum wires
Electron tunneling
SOI (semiconductors)
quantum wires
electron tunneling
field effect transistors
oscillations
floating
CMOS
impedance
Networks (circuits)
Electric potential
output
electric potential

Keywords

  • Coulomb blockade
  • MOSFETs
  • Quantum wire
  • Silicon
  • Single electron tunneling
  • SOI

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Coulomb blockade effects in edge quantum wire SOI MOSFETs. / Ohata, Akiko; Toriumi, Akira; Uchida, Ken.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 36, No. 3 SUPPL. B, 03.1997, p. 1686-1689.

Research output: Contribution to journalArticle

Ohata, Akiko ; Toriumi, Akira ; Uchida, Ken. / Coulomb blockade effects in edge quantum wire SOI MOSFETs. In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 1997 ; Vol. 36, No. 3 SUPPL. B. pp. 1686-1689.
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