Creep failure simulations of 316H at 550°C: Part I - A method and validation

Chang Sik Oh, Nak Hyun Kim, Yun Jae Kim, Catrin Davies, Kamran Nikbin, David Dean

Research output: Contribution to journalArticlepeer-review

68 Citations (Scopus)

Fingerprint Dive into the research topics of 'Creep failure simulations of 316H at 550°C: Part I - A method and validation'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science