Cu(In1-xGax)Se2 growth studies by in situ spectroscopic light scattering

R. Scheer; A. Neisser; K. Sakurai; P. Fons; S. Niki

doi:10.1063/1.1563309

Cu(In_1-xGa_x)Se₂ growth studies by in situ spectroscopic light scattering

R. Scheer, A. Neisser, K. Sakurai, P. Fons, S. Niki

Research output: Contribution to journal › Article › peer-review

48 Citations (Scopus)

Abstract

The spectroscopic light scattering was used to study the growth of polycrystalline Cu(In_1-xGa_x)Se₂ thin films. A three-stage deposition process was used for the growth of the films. The ways to adjust the final roughness of a film was discussed. The spectroscopic light scattering was on-line monitored for process control.

Original language	English
Pages (from-to)	2091-2093
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	13
DOIs	https://doi.org/10.1063/1.1563309
Publication status	Published - 2003 Mar 31
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.1563309

Cite this

@article{6cf454ab80a848cdbe315f24eceb033e,

title = "Cu(In1-xGax)Se2 growth studies by in situ spectroscopic light scattering",

abstract = "The spectroscopic light scattering was used to study the growth of polycrystalline Cu(In1-xGax)Se2 thin films. A three-stage deposition process was used for the growth of the films. The ways to adjust the final roughness of a film was discussed. The spectroscopic light scattering was on-line monitored for process control.",

author = "R. Scheer and A. Neisser and K. Sakurai and P. Fons and S. Niki",

year = "2003",

month = mar,

day = "31",

doi = "10.1063/1.1563309",

language = "English",

volume = "82",

pages = "2091--2093",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "13",

}

TY - JOUR

T1 - Cu(In1-xGax)Se2 growth studies by in situ spectroscopic light scattering

AU - Scheer, R.

AU - Neisser, A.

AU - Sakurai, K.

AU - Fons, P.

AU - Niki, S.

PY - 2003/3/31

Y1 - 2003/3/31

N2 - The spectroscopic light scattering was used to study the growth of polycrystalline Cu(In1-xGax)Se2 thin films. A three-stage deposition process was used for the growth of the films. The ways to adjust the final roughness of a film was discussed. The spectroscopic light scattering was on-line monitored for process control.

AB - The spectroscopic light scattering was used to study the growth of polycrystalline Cu(In1-xGax)Se2 thin films. A three-stage deposition process was used for the growth of the films. The ways to adjust the final roughness of a film was discussed. The spectroscopic light scattering was on-line monitored for process control.

UR - http://www.scopus.com/inward/record.url?scp=0037474943&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037474943&partnerID=8YFLogxK

U2 - 10.1063/1.1563309

DO - 10.1063/1.1563309

M3 - Article

AN - SCOPUS:0037474943

SN - 0003-6951

VL - 82

SP - 2091

EP - 2093

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

Cu(In_1-xGa_x)Se₂ growth studies by in situ spectroscopic light scattering

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this