Cu(In1-xGax)Se2 growth studies by in situ spectroscopic light scattering

R. Scheer, A. Neisser, K. Sakurai, P. Fons, S. Niki

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

The spectroscopic light scattering was used to study the growth of polycrystalline Cu(In1-xGax)Se2 thin films. A three-stage deposition process was used for the growth of the films. The ways to adjust the final roughness of a film was discussed. The spectroscopic light scattering was on-line monitored for process control.

Original languageEnglish
Pages (from-to)2091-2093
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number13
DOIs
Publication statusPublished - 2003 Mar 31
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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