Degradation mechanism with impurities and life time estimation for SOFCs

T. Horita, D. H. Cho, F. Wang, M. Nishi, T. Shimonosono, H. Kishimoto, K. Yamaji, M. E. Brito, H. Yokokawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

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Engineering & Materials Science