TY - JOUR
T1 - Densely Arrayed Active Antennas Embedded in Vertical Nanoholes for Backside-Illuminated Silicon-Based Broadband Infrared Photodetection
AU - Yasunaga, Shun
AU - Takahashi, Hidetoshi
AU - Takahata, Tomoyuki
AU - Shimoyama, Isao
AU - Kan, Tetsuo
N1 - Funding Information:
The EB lithography and the Bosch process were performed using the facility of the VLSI Design and Education Center (VDEC), the University of Tokyo, which was reorganized as d.lab in October 2019. This work was financially supported by NEDO (New Energy and Industrial Technology Development Organization), Japan.
Funding Information:
The EB lithography and the Bosch process were performed using the facility of the VLSI Design and Education Center (VDEC), the University of Tokyo, which was reorganized as d.lab in October 2019. This work was financially supported by NEDO (New Energy and Industrial Technology Development Organization), Japan.
Publisher Copyright:
© 2020 Wiley-VCH GmbH
PY - 2020/11/1
Y1 - 2020/11/1
N2 - Plasmonic metal nanoantennas arrayed on silicon have attracted attention as silicon-based sub-bandgap infrared detectors. Localized surface plasmons induced on metal nanoblocks can provide a broadband responsivity, and the silicon-based configuration offers the potential for complementary metal oxide semiconductor-compatible infrared photodetectors. The responsivity of such devices, however, needs further improvement. In this report, a nanoantenna structure consisting of a nanoblock with electrical connection to it built in a narrow, vertical, and deep nanohole is presented, which generates a photocurrent in response to backside illumination. Inclined evaporative deposition of copper onto an array of nanoholes, 150 nm in diameter and 560 nm in depth, simultaneously forms nanoblocks and thin conductive films. The structure's effectiveness is demonstrated from the reflectance and responsivity to infrared laser illumination 1.1–1.8 µm in wavelength. When the periodicity of the nanoholes is 500 nm, a responsivity of 9.8 mA W−1 at 1.55 µm is obtained, which is sustained over a broad band. The responsivity–density relationship has a limitation between periodicities of 250 and 500 nm, possibly because of overlapped near fields around antennas and the resultant altered resonant mode. With its simple fabrication and efficient functionality, the nanoantenna structure contributes to the realization of silicon-based infrared imaging.
AB - Plasmonic metal nanoantennas arrayed on silicon have attracted attention as silicon-based sub-bandgap infrared detectors. Localized surface plasmons induced on metal nanoblocks can provide a broadband responsivity, and the silicon-based configuration offers the potential for complementary metal oxide semiconductor-compatible infrared photodetectors. The responsivity of such devices, however, needs further improvement. In this report, a nanoantenna structure consisting of a nanoblock with electrical connection to it built in a narrow, vertical, and deep nanohole is presented, which generates a photocurrent in response to backside illumination. Inclined evaporative deposition of copper onto an array of nanoholes, 150 nm in diameter and 560 nm in depth, simultaneously forms nanoblocks and thin conductive films. The structure's effectiveness is demonstrated from the reflectance and responsivity to infrared laser illumination 1.1–1.8 µm in wavelength. When the periodicity of the nanoholes is 500 nm, a responsivity of 9.8 mA W−1 at 1.55 µm is obtained, which is sustained over a broad band. The responsivity–density relationship has a limitation between periodicities of 250 and 500 nm, possibly because of overlapped near fields around antennas and the resultant altered resonant mode. With its simple fabrication and efficient functionality, the nanoantenna structure contributes to the realization of silicon-based infrared imaging.
KW - Schottky junctions
KW - infrared detectors
KW - localized surface plasmons
KW - plasmonics
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U2 - 10.1002/admi.202001039
DO - 10.1002/admi.202001039
M3 - Article
AN - SCOPUS:85090985355
SN - 2196-7350
VL - 7
JO - Advanced Materials Interfaces
JF - Advanced Materials Interfaces
IS - 21
M1 - 2001039
ER -