Density measurement for carbon nanotube film grown on flat substrates

Kazuhiko Omote, Raita Hirose, Naoya Imayama, Kei Noda, Ryo Endoh, Naoyuki Sugiyama

Research output: Contribution to journalArticle

Abstract

An X-ray absorption method for measuring the density of vertically aligned carbon nanotube film grown on a flat substrate is proposed. X-rays can penetrate the film parallel to the surface direction, and the transmitted X-rays are detected by an X-ray camera, which enables the film, substrate, and air regions to be distinguished in the observed X-ray image. When the sample surface is aligned just parallel to the penetrating direction of the X-rays, the transmittance of the film can be observed. The film density is calculated from the observed transmittance if the elemental composition of the film material is known.

Original languageEnglish
Article number016501
JournalApplied Physics Express
Volume13
Issue number1
DOIs
Publication statusPublished - 2020 Jan 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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