Dependence of recorded bit-patterns on saturation magnetization in microwave assisted magnetic recording

Terumitsu Tanaka, Ayumu Kato, Satoshi Kawano, Naoyuki Narita, Yukio Nozaki, Yasushi Kanai, Kimihide Matsuyama

Research output: Contribution to journalArticle

Abstract

Signal recording processes were simulated using micromagnetic calculation for microwave assisted magnetic recording in perpendicular magnetic media. Strong magnetostatic field caused by the large saturation magnetization of the media tends to deteriorate recorded bit patterns resulting in low signal to noise ratio for the play back signal. The moderate exchange interaction fields were shown to improve recording characteristics and increase signal to noise ratio even for the large saturation magnetization media. The influence of thermal fluctuation fields on recording characteristics was also discussed and the influence was negligible for the media assumed in this study.

Original languageEnglish
JournalIEEJ Transactions on Fundamentals and Materials
Volume130
Issue number7
DOIs
Publication statusPublished - 2010
Externally publishedYes

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Magnetic recording
Saturation magnetization
Signal to noise ratio
Microwaves
Magnetostatics
Exchange interactions
Hot Temperature

Keywords

  • Micromagnetic simulation
  • Microwave assisted magnetic recording
  • Perpendicular magnetic recording

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Dependence of recorded bit-patterns on saturation magnetization in microwave assisted magnetic recording. / Tanaka, Terumitsu; Kato, Ayumu; Kawano, Satoshi; Narita, Naoyuki; Nozaki, Yukio; Kanai, Yasushi; Matsuyama, Kimihide.

In: IEEJ Transactions on Fundamentals and Materials, Vol. 130, No. 7, 2010.

Research output: Contribution to journalArticle

Tanaka, Terumitsu ; Kato, Ayumu ; Kawano, Satoshi ; Narita, Naoyuki ; Nozaki, Yukio ; Kanai, Yasushi ; Matsuyama, Kimihide. / Dependence of recorded bit-patterns on saturation magnetization in microwave assisted magnetic recording. In: IEEJ Transactions on Fundamentals and Materials. 2010 ; Vol. 130, No. 7.
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