Design and implementation of near-field scanning optical microscope for observation of interfacial liquid crystal orientation

Toshiyasu Tadokoro, Toshiharu Saiki, Hirokazu Toriumi

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

A near-field scanning optical microscope (NSOM), optimized for observation of liquid crystal (LC) orientation at the LC/alignment layer interface, has been developed. The NSOM operates in the illumination mode using a metal-coated optical fiber probe together with a probe-positioning system based on the optical feedback technique. This novel system enables the depth profiling and two-dimensional imaging of the LC orientation distribution under an applied local electric field with high spatial resolution. In this paper we describe the design and implementation of the developed NSOM system and report its first application to the microscopic analysis of LC orientation at the LC/alignment layer interface.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume41
Issue number2 A
Publication statusPublished - 2002 Feb 1
Externally publishedYes

Fingerprint

optical microscopes
Crystal orientation
Liquid crystals
near fields
Microscopes
liquid crystals
Scanning
scanning
alignment
metal fibers
Optical feedback
Depth profiling
probes
positioning
Optical fibers
spatial resolution
Lighting
optical fibers
illumination
Electric fields

Keywords

  • Anchoring effect
  • Depth profiling
  • Evanescent field
  • Liquid crystal
  • Near-field scanning optical microscope (NSOM)
  • Orientation
  • Polarization

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

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abstract = "A near-field scanning optical microscope (NSOM), optimized for observation of liquid crystal (LC) orientation at the LC/alignment layer interface, has been developed. The NSOM operates in the illumination mode using a metal-coated optical fiber probe together with a probe-positioning system based on the optical feedback technique. This novel system enables the depth profiling and two-dimensional imaging of the LC orientation distribution under an applied local electric field with high spatial resolution. In this paper we describe the design and implementation of the developed NSOM system and report its first application to the microscopic analysis of LC orientation at the LC/alignment layer interface.",
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AU - Toriumi, Hirokazu

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KW - Polarization

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