Determination of the composition of strained tetragonal epilayers

P. Fons, D. J. Bottomley, D. J. Tweet, S. Niki, A. Yamada

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Elasticity theory is applied to calculate the total strain present in a tetragonal symmetry epilayer due to heteroepitaxial misfit. By relating pseudobinary alloy composition to the lattice constants of the epilayer, it is shown that the composition of a pseudobinary epilayer can be determined from measurement of the strained epilayer lattice constants. This is accomplished by expressing the misfit strain in terms of the composition and the individual lattice constants of the component of the epilayer and using Vegard's rule. As a result, determination of the composition of two chalcopyrite symmetry epilayers from x-ray diffraction measurements is demonstrated. The approach presented here is general and can be applied to any substrate-epilayer combination in the elastic limit.

Original languageEnglish
Pages (from-to)761-763
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number6
DOIs
Publication statusPublished - 1996 Aug 5
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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