Development of a low temperature scanning probe microscope

Kohta Saitoh; Kenichi Hayashi; Yoshiyuki Shibayama; Keiya Shirahama

doi:10.1007/s10909-007-9584-6

Development of a low temperature scanning probe microscope

Kohta Saitoh, Kenichi Hayashi, Yoshiyuki Shibayama, Keiya Shirahama

Department of Physics

Research output: Contribution to journal › Article

7 Citations (Scopus)

Abstract

A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.

Original language	English
Pages (from-to)	561-566
Number of pages	6
Journal	Journal of Low Temperature Physics
Volume	150
Issue number	3-4
DOIs	https://doi.org/10.1007/s10909-007-9584-6
Publication status	Published - 2008 Feb 1

Keywords

Low temperature instrumentation and new techniques

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Materials Science(all)
Condensed Matter Physics

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Saitoh, K., Hayashi, K., Shibayama, Y., & Shirahama, K. (2008). Development of a low temperature scanning probe microscope. Journal of Low Temperature Physics, 150(3-4), 561-566. https://doi.org/10.1007/s10909-007-9584-6

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AU - Shirahama, Keiya

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