Development of a low temperature scanning probe microscope

Kohta Saitoh, Kenichi Hayashi, Yoshiyuki Shibayama, Keiya Shirahama

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.

Original languageEnglish
Pages (from-to)561-566
Number of pages6
JournalJournal of Low Temperature Physics
Volume150
Issue number3-4
DOIs
Publication statusPublished - 2008 Feb

Fingerprint

Microscopes
microscopes
Scanning
forks
Quartz
scanning
probes
Diffraction gratings
Frequency modulation
gratings (spectra)
frequency modulation
Atomic force microscopy
quartz
Tuning
tuning
atomic force microscopy
Imaging techniques
Temperature

Keywords

  • Low temperature instrumentation and new techniques

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Development of a low temperature scanning probe microscope. / Saitoh, Kohta; Hayashi, Kenichi; Shibayama, Yoshiyuki; Shirahama, Keiya.

In: Journal of Low Temperature Physics, Vol. 150, No. 3-4, 02.2008, p. 561-566.

Research output: Contribution to journalArticle

Saitoh, Kohta ; Hayashi, Kenichi ; Shibayama, Yoshiyuki ; Shirahama, Keiya. / Development of a low temperature scanning probe microscope. In: Journal of Low Temperature Physics. 2008 ; Vol. 150, No. 3-4. pp. 561-566.
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