TY - JOUR
T1 - Development of a low temperature scanning probe microscope
AU - Saitoh, Kohta
AU - Hayashi, Kenichi
AU - Shibayama, Yoshiyuki
AU - Shirahama, Keiya
N1 - Funding Information:
Acknowledgements The authors thank Toshu An, Yukio Hasegawa, and Tomoko Shimizu for fruitful discussion. This work is supported by Grant-in-Aid for Scientific Research from MEXT, Japan.
PY - 2008/2
Y1 - 2008/2
N2 - A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.
AB - A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.
KW - Low temperature instrumentation and new techniques
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U2 - 10.1007/s10909-007-9584-6
DO - 10.1007/s10909-007-9584-6
M3 - Article
AN - SCOPUS:38549119548
VL - 150
SP - 561
EP - 566
JO - Journal of Low Temperature Physics
JF - Journal of Low Temperature Physics
SN - 0022-2291
IS - 3-4
ER -