Development of damage detection system for container

Kazuo Nakazawa, Itaru Iwasaki, Ichiro Yamashita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

There is a strong demand for an automatic detection system of damage on surface of a container. The system have to detect holes or cracks distinguishing from painting, dirt, dent, rust and so on. So it is very difficult to distinguish it from them using an image obtained by a 2-D CCD camera. To overcome this problem, we propose a method for detecting holes and cracks easily by controlling lights. This method actively detect condition of the surface and this is based on the Photometric Stereo Method.

Original languageEnglish
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
PublisherIEEE
Pages1160-1163
Number of pages4
Volume2
Publication statusPublished - 1995
EventProceedings of the 1995 IEEE 21st International Conference on Industrial Electronics, Control, and Instrumentation. Part 1 (of 2) - Orlando, FL, USA
Duration: 1995 Nov 61995 Nov 10

Other

OtherProceedings of the 1995 IEEE 21st International Conference on Industrial Electronics, Control, and Instrumentation. Part 1 (of 2)
CityOrlando, FL, USA
Period95/11/695/11/10

Fingerprint

Damage detection
Containers
Cracks
Painting
CCD cameras

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Nakazawa, K., Iwasaki, I., & Yamashita, I. (1995). Development of damage detection system for container. In IECON Proceedings (Industrial Electronics Conference) (Vol. 2, pp. 1160-1163). IEEE.

Development of damage detection system for container. / Nakazawa, Kazuo; Iwasaki, Itaru; Yamashita, Ichiro.

IECON Proceedings (Industrial Electronics Conference). Vol. 2 IEEE, 1995. p. 1160-1163.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakazawa, K, Iwasaki, I & Yamashita, I 1995, Development of damage detection system for container. in IECON Proceedings (Industrial Electronics Conference). vol. 2, IEEE, pp. 1160-1163, Proceedings of the 1995 IEEE 21st International Conference on Industrial Electronics, Control, and Instrumentation. Part 1 (of 2), Orlando, FL, USA, 95/11/6.
Nakazawa K, Iwasaki I, Yamashita I. Development of damage detection system for container. In IECON Proceedings (Industrial Electronics Conference). Vol. 2. IEEE. 1995. p. 1160-1163
Nakazawa, Kazuo ; Iwasaki, Itaru ; Yamashita, Ichiro. / Development of damage detection system for container. IECON Proceedings (Industrial Electronics Conference). Vol. 2 IEEE, 1995. pp. 1160-1163
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