Development of nanometer scale temperature measurement method with polarized near-field light

Shunsuke Hosaka, Jumpei Nitta, Yoshihiro Taguchi, Yuji Nagasaka, Toshiharu Saiki

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

Original languageEnglish
Title of host publicationInternational Conference on Optical MEMS and Nanophotonics
Pages59-60
Number of pages2
DOIs
Publication statusPublished - 2011
Event16th International Conference on Optical MEMS and Nanophotonics, OMN2011 - Istanbul, Turkey
Duration: 2011 Aug 8 → 2011 Aug 11

Other

Other16th International Conference on Optical MEMS and Nanophotonics, OMN2011
CountryTurkey
CityIstanbul
Period11/8/8 → 11/8/11

Fingerprint

Temperature measurement
Lighting
Polarization

Keywords

  • Near-field optics
  • Polarization
  • Thermometry

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Hosaka, S., Nitta, J., Taguchi, Y., Nagasaka, Y., & Saiki, T. (2011). Development of nanometer scale temperature measurement method with polarized near-field light. In International Conference on Optical MEMS and Nanophotonics (pp. 59-60). [6031103] https://doi.org/10.1109/OMEMS.2011.6031103

Development of nanometer scale temperature measurement method with polarized near-field light. / Hosaka, Shunsuke; Nitta, Jumpei; Taguchi, Yoshihiro; Nagasaka, Yuji; Saiki, Toshiharu.

International Conference on Optical MEMS and Nanophotonics. 2011. p. 59-60 6031103.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hosaka, S, Nitta, J, Taguchi, Y, Nagasaka, Y & Saiki, T 2011, Development of nanometer scale temperature measurement method with polarized near-field light. in International Conference on Optical MEMS and Nanophotonics., 6031103, pp. 59-60, 16th International Conference on Optical MEMS and Nanophotonics, OMN2011, Istanbul, Turkey, 11/8/8. https://doi.org/10.1109/OMEMS.2011.6031103
Hosaka S, Nitta J, Taguchi Y, Nagasaka Y, Saiki T. Development of nanometer scale temperature measurement method with polarized near-field light. In International Conference on Optical MEMS and Nanophotonics. 2011. p. 59-60. 6031103 https://doi.org/10.1109/OMEMS.2011.6031103
Hosaka, Shunsuke ; Nitta, Jumpei ; Taguchi, Yoshihiro ; Nagasaka, Yuji ; Saiki, Toshiharu. / Development of nanometer scale temperature measurement method with polarized near-field light. International Conference on Optical MEMS and Nanophotonics. 2011. pp. 59-60
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