Development of nanometer scale temperature measurement method with polarized near-field light

Shunsuke Hosaka; Jumpei Nitta; Yoshihiro Taguchi; Yuji Nagasaka; Toshiharu Saiki

doi:10.1109/OMEMS.2011.6031103

Development of nanometer scale temperature measurement method with polarized near-field light

Shunsuke Hosaka, Jumpei Nitta, Yoshihiro Taguchi, Yuji Nagasaka, Toshiharu Saiki

Department of System Design Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

Original language	English
Title of host publication	Proceedings - OMN2011
Subtitle of host publication	16th International Conference on Optical MEMS and Nanophotonics
Pages	59-60
Number of pages	2
DOIs	https://doi.org/10.1109/OMEMS.2011.6031103
Publication status	Published - 2011 Dec 12
Event	16th International Conference on Optical MEMS and Nanophotonics, OMN2011 - Istanbul, Turkey Duration: 2011 Aug 8 → 2011 Aug 11

Publication series

Name	International Conference on Optical MEMS and Nanophotonics
ISSN (Print)	2160-5033
ISSN (Electronic)	2160-5041

Other

Other	16th International Conference on Optical MEMS and Nanophotonics, OMN2011
Country/Territory	Turkey
City	Istanbul
Period	11/8/8 → 11/8/11

Keywords

Near-field optics
Polarization
Thermometry

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/OMEMS.2011.6031103

Cite this

Hosaka, S., Nitta, J., Taguchi, Y., Nagasaka, Y., & Saiki, T. (2011). Development of nanometer scale temperature measurement method with polarized near-field light. In Proceedings - OMN2011: 16th International Conference on Optical MEMS and Nanophotonics (pp. 59-60). [6031103] (International Conference on Optical MEMS and Nanophotonics). https://doi.org/10.1109/OMEMS.2011.6031103

Development of nanometer scale temperature measurement method with polarized near-field light. / Hosaka, Shunsuke; Nitta, Jumpei; Taguchi, Yoshihiro; Nagasaka, Yuji; Saiki, Toshiharu.

Proceedings - OMN2011: 16th International Conference on Optical MEMS and Nanophotonics. 2011. p. 59-60 6031103 (International Conference on Optical MEMS and Nanophotonics).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hosaka, S, Nitta, J, Taguchi, Y, Nagasaka, Y & Saiki, T 2011, Development of nanometer scale temperature measurement method with polarized near-field light. in Proceedings - OMN2011: 16th International Conference on Optical MEMS and Nanophotonics., 6031103, International Conference on Optical MEMS and Nanophotonics, pp. 59-60, 16th International Conference on Optical MEMS and Nanophotonics, OMN2011, Istanbul, Turkey, 11/8/8. https://doi.org/10.1109/OMEMS.2011.6031103

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title = "Development of nanometer scale temperature measurement method with polarized near-field light",

abstract = "We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.",

keywords = "Near-field optics, Polarization, Thermometry",

author = "Shunsuke Hosaka and Jumpei Nitta and Yoshihiro Taguchi and Yuji Nagasaka and Toshiharu Saiki",

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doi = "10.1109/OMEMS.2011.6031103",

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AU - Hosaka, Shunsuke

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AU - Saiki, Toshiharu

PY - 2011/12/12

Y1 - 2011/12/12

N2 - We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

AB - We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

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BT - Proceedings - OMN2011

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ER -

Development of nanometer scale temperature measurement method with polarized near-field light

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

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