Development of nanometer scale temperature measurement method with polarized near-field light

Shunsuke Hosaka, Jumpei Nitta, Yoshihiro Taguchi, Yuji Nagasaka, Toshiharu Saiki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.

Original languageEnglish
Title of host publicationProceedings - OMN2011
Subtitle of host publication16th International Conference on Optical MEMS and Nanophotonics
Pages59-60
Number of pages2
DOIs
Publication statusPublished - 2011 Dec 12
Event16th International Conference on Optical MEMS and Nanophotonics, OMN2011 - Istanbul, Turkey
Duration: 2011 Aug 82011 Aug 11

Publication series

NameInternational Conference on Optical MEMS and Nanophotonics
ISSN (Print)2160-5033
ISSN (Electronic)2160-5041

Other

Other16th International Conference on Optical MEMS and Nanophotonics, OMN2011
CountryTurkey
CityIstanbul
Period11/8/811/8/11

Keywords

  • Near-field optics
  • Polarization
  • Thermometry

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Hosaka, S., Nitta, J., Taguchi, Y., Nagasaka, Y., & Saiki, T. (2011). Development of nanometer scale temperature measurement method with polarized near-field light. In Proceedings - OMN2011: 16th International Conference on Optical MEMS and Nanophotonics (pp. 59-60). [6031103] (International Conference on Optical MEMS and Nanophotonics). https://doi.org/10.1109/OMEMS.2011.6031103