Development of semiconductor gamma-camera system with CdZnTe detectors

Koichi Ogawa, Atsushi Ohta, Keisei Shuto, Nobutoku Motomura, Hiroaki Kobayashi, Shunichiro Makino, Tadaki Nakahara, Atsushi Kubo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

A CdZnTe semiconductor detector, which works at room temperature, may realize a next generation gammacamera system due to its high spatial resolution and high energy resolution. We made a prototype gamma-camera system with CdZnTe detectors to evaluate the feasibility of the semiconductor gamma-camera. This paper described our prototype system and some results obtained with this system.

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2426-2429
Number of pages4
ISBN (Print)1424405610, 9781424405619
DOIs
Publication statusPublished - 2006 Jan 1
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: 2006 Oct 292006 Nov 4

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume4
ISSN (Print)1095-7863

Other

Other2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
CountryUnited States
CitySan Diego, CA
Period06/10/2906/11/4

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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  • Cite this

    Ogawa, K., Ohta, A., Shuto, K., Motomura, N., Kobayashi, H., Makino, S., Nakahara, T., & Kubo, A. (2006). Development of semiconductor gamma-camera system with CdZnTe detectors. In 2006 IEEE Nuclear Science Symposium - Conference Record (pp. 2426-2429). [4179516] (IEEE Nuclear Science Symposium Conference Record; Vol. 4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2006.354402