Distortion of fluorescence line profile due to laser radiation pressure in an RF trap

T. Hasegawa, D. Tanooka, T. Shimizu

Research output: Contribution to journalConference article

Abstract

Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.

Original languageEnglish
Pages (from-to)335-336
Number of pages2
JournalCPEM Digest (Conference on Precision Electromagnetic Measurements)
Publication statusPublished - 1998 Dec 1
Externally publishedYes
EventProceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA
Duration: 1998 Jul 61998 Jul 10

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Electrical and Electronic Engineering

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