Distortion of fluorescence line profile due to laser radiation pressure in an RF trap

Taro Hasegawa, D. Tanooka, T. Shimizu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.

Original languageEnglish
Title of host publicationCPEM Digest (Conference on Precision Electromagnetic Measurements)
EditorsT.L. Nelson
PublisherIEEE
Pages335-336
Number of pages2
Publication statusPublished - 1998
Externally publishedYes
EventProceedings of the 1998 Conference Precision Electromagnetic Measurements - Washington, DC, USA
Duration: 1998 Jul 61998 Jul 10

Other

OtherProceedings of the 1998 Conference Precision Electromagnetic Measurements
CityWashington, DC, USA
Period98/7/698/7/10

Fingerprint

radiation pressure
Laser radiation
Fluorescence
traps
Trapped ions
laser beams
fluorescence
profiles
laser induced fluorescence
line spectra
collisions
Lasers
radiation
ions

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Hasegawa, T., Tanooka, D., & Shimizu, T. (1998). Distortion of fluorescence line profile due to laser radiation pressure in an RF trap. In T. L. Nelson (Ed.), CPEM Digest (Conference on Precision Electromagnetic Measurements) (pp. 335-336). IEEE.

Distortion of fluorescence line profile due to laser radiation pressure in an RF trap. / Hasegawa, Taro; Tanooka, D.; Shimizu, T.

CPEM Digest (Conference on Precision Electromagnetic Measurements). ed. / T.L. Nelson. IEEE, 1998. p. 335-336.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hasegawa, T, Tanooka, D & Shimizu, T 1998, Distortion of fluorescence line profile due to laser radiation pressure in an RF trap. in TL Nelson (ed.), CPEM Digest (Conference on Precision Electromagnetic Measurements). IEEE, pp. 335-336, Proceedings of the 1998 Conference Precision Electromagnetic Measurements, Washington, DC, USA, 98/7/6.
Hasegawa T, Tanooka D, Shimizu T. Distortion of fluorescence line profile due to laser radiation pressure in an RF trap. In Nelson TL, editor, CPEM Digest (Conference on Precision Electromagnetic Measurements). IEEE. 1998. p. 335-336
Hasegawa, Taro ; Tanooka, D. ; Shimizu, T. / Distortion of fluorescence line profile due to laser radiation pressure in an RF trap. CPEM Digest (Conference on Precision Electromagnetic Measurements). editor / T.L. Nelson. IEEE, 1998. pp. 335-336
@inproceedings{b55991ec8ccc4163aff4d0ddcfd6f6d7,
title = "Distortion of fluorescence line profile due to laser radiation pressure in an RF trap",
abstract = "Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.",
author = "Taro Hasegawa and D. Tanooka and T. Shimizu",
year = "1998",
language = "English",
pages = "335--336",
editor = "T.L. Nelson",
booktitle = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",
publisher = "IEEE",

}

TY - GEN

T1 - Distortion of fluorescence line profile due to laser radiation pressure in an RF trap

AU - Hasegawa, Taro

AU - Tanooka, D.

AU - Shimizu, T.

PY - 1998

Y1 - 1998

N2 - Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.

AB - Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped ions in an rf trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.

UR - http://www.scopus.com/inward/record.url?scp=0032288254&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032288254&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0032288254

SP - 335

EP - 336

BT - CPEM Digest (Conference on Precision Electromagnetic Measurements)

A2 - Nelson, T.L.

PB - IEEE

ER -