Dual-probe scanning near-field optical microscopy (DSNOM) utilizing ultrafast plasmon nano-focusing

Yasuhiro Kojima, Yuta Masaki, Fumihiko Kannari

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
Publication statusPublished - 2016 Dec 16
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 2016 Jun 52016 Jun 10

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
CountryUnited States
CitySan Jose
Period16/6/516/6/10

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Kojima, Y., Masaki, Y., & Kannari, F. (2016). Dual-probe scanning near-field optical microscopy (DSNOM) utilizing ultrafast plasmon nano-focusing. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7788243] (2016 Conference on Lasers and Electro-Optics, CLEO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/cleo_at.2016.jtu5a.68