Dual-probe Scanning Near-field Optical Microscopy (DSNOM) Utilizing Ultrafast Plasmon Nano-focusing

Yasuhiro Kojima, Yuta Masaki, Fumihiko Kannari

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dual-probe scanning near-field optical microscopy combining spectral interferometry (SI-DSNOM) which utilizes ultrafast surface-plasmon polariton nanofocusing as excitation light is constructed and experimentally demonstrated. We achieve spatiotemporal resolution of 100 nm and 10 fs.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO AT 2016
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781557528209
Publication statusPublished - 2016
EventCLEO: Applications and Technology, CLEO AT 2016 - San Jose, United States
Duration: 2016 Jun 52016 Jun 10

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceCLEO: Applications and Technology, CLEO AT 2016
Country/TerritoryUnited States
CitySan Jose
Period16/6/516/6/10

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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