Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide

Takumi Yamamoto; Yasutomo Ota; Satomi Ishida; Naoto Kumagai; Satoshi Iwamoto; Yasuhiko Arakawa

doi:10.1109/MOC.2015.7416502

Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide

Takumi Yamamoto, Yasutomo Ota, Satomi Ishida, Naoto Kumagai, Satoshi Iwamoto, Yasuhiko Arakawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We measured the emission decay rates of self-assembled InAs single quantum dots (QDs) embedded in subwavelength-width semiconductor waveguides with and without Au side claddings. The Au claddings increased the decay rate of single QDs by ∼2 times, which is consistent with numerical simulations taking account of fabrication imperfection.

Original language	English
Title of host publication	MOC 2015 - Technical Digest of 20th Microoptics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9784863485433
DOIs	https://doi.org/10.1109/MOC.2015.7416502
Publication status	Published - 2016 Feb 23
Externally published	Yes
Event	20th Microoptics Conference, MOC 2015 - Fukuoka, Japan Duration: 2015 Oct 25 → 2015 Oct 28

Publication series

Name	MOC 2015 - Technical Digest of 20th Microoptics Conference

Other

Other	20th Microoptics Conference, MOC 2015
Country/Territory	Japan
City	Fukuoka
Period	15/10/25 → 15/10/28

Keywords

Gold
Numerical simulation
Periodic structures
Quantum dots
Semiconductor device measurement
Semiconductor waveguides

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/MOC.2015.7416502

Cite this

Yamamoto, T., Ota, Y., Ishida, S., Kumagai, N., Iwamoto, S., & Arakawa, Y. (2016). Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide. In MOC 2015 - Technical Digest of 20th Microoptics Conference [7416502] (MOC 2015 - Technical Digest of 20th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MOC.2015.7416502

Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide. / Yamamoto, Takumi; Ota, Yasutomo; Ishida, Satomi et al.
MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2016. 7416502 (MOC 2015 - Technical Digest of 20th Microoptics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yamamoto, T, Ota, Y, Ishida, S, Kumagai, N, Iwamoto, S & Arakawa, Y 2016, Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide. in MOC 2015 - Technical Digest of 20th Microoptics Conference., 7416502, MOC 2015 - Technical Digest of 20th Microoptics Conference, Institute of Electrical and Electronics Engineers Inc., 20th Microoptics Conference, MOC 2015, Fukuoka, Japan, 15/10/25. https://doi.org/10.1109/MOC.2015.7416502

Yamamoto T, Ota Y, Ishida S, Kumagai N, Iwamoto S, Arakawa Y. Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide. In MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc. 2016. 7416502. (MOC 2015 - Technical Digest of 20th Microoptics Conference). doi: 10.1109/MOC.2015.7416502

Yamamoto, Takumi ; Ota, Yasutomo ; Ishida, Satomi et al. / Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide. MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2016. (MOC 2015 - Technical Digest of 20th Microoptics Conference).

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abstract = "We measured the emission decay rates of self-assembled InAs single quantum dots (QDs) embedded in subwavelength-width semiconductor waveguides with and without Au side claddings. The Au claddings increased the decay rate of single QDs by ∼2 times, which is consistent with numerical simulations taking account of fabrication imperfection.",

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Effect of metal side claddings on emission decay rate of single quantum dots embedded in a subwavelength semiconductor waveguide

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