Effect of substrate-film lattice mismatch in La0.7Ba0.3MnO3-δ thin films for transport properties

K. Hayashi, E. Ohta, H. Wada

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A study on the effect of substrate-film lattice mismatch in thin films of lanthanum barium manganese oxide was performed. The films were deposited on substrates using laser ablation to obtain a high temperature coefficient of resistance. The microstructure of films was analyzed using X-ray diffraction and atomic force microscopy. A misfit stress was caused due to the lattice mismatch which changed the surface structure of the films and their temperature dependence of resistivity. Results indicated that the films could be used as an uncooled infrared bolometer material.

Original languageEnglish
Pages (from-to)2905-2909
Number of pages5
JournalJournal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
Volume19
Issue number6
DOIs
Publication statusPublished - 2001 Nov

Fingerprint

Lattice mismatch
Transport properties
transport properties
Thin films
Substrates
thin films
barium oxides
Lanthanum
Bolometers
Manganese oxide
manganese oxides
bolometers
Laser ablation
Barium
lanthanum
Surface structure
laser ablation
Atomic force microscopy
atomic force microscopy
Infrared radiation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Physics and Astronomy (miscellaneous)

Cite this

Effect of substrate-film lattice mismatch in La0.7Ba0.3MnO3-δ thin films for transport properties. / Hayashi, K.; Ohta, E.; Wada, H.

In: Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Vol. 19, No. 6, 11.2001, p. 2905-2909.

Research output: Contribution to journalArticle

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