Effects of interface traps in silicon-quantum-dots-based memory structures

Yuan Xiaoli, Shi Yi, Gu Shulin, Zhu Jianmin, Zheng Youdou, Saito Kenichi, Ishikuro Hiroki, Hiramoto Toshiro

Research output: Contribution to journalConference articlepeer-review

13 Citations (Scopus)

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Chemical Compounds

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